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经典书籍：TEM（透射电镜）的物理成像（英文第五版）
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Transmission Electron Microscopy: Physics of Image Formation, 5th ed. Author(s): L. Reimer, H. Kohl Series: Springer Series in Optical Sciences 36 Publisher: Springer Year: 2008 Edition: 5th Language: English Pages: 602 Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again. Table of contents : TEM: Physics of Image Formation......Page 1 front-matter.pdf......Page 2 1 Introduction......Page 17 2 Particle Optics of Electrons......Page 32 3 Wave Optics of Electrons......Page 59 4 Elements of a Transmission Electron Microscope......Page 91 5 Electron–Specimen Interactions......Page 155 6 Scattering and Phase Contrast for Amorphous Specimens......Page 209 7 Theory of Electron Diffraction......Page 286 8 Electron-Diffraction Modes and Applications......Page 342 9 Imaging of Crystalline Specimens and Their Defects......Page 372 10 Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy......Page 432 11 Specimen Damage by Electron Irradiation......Page 472 back-matter.pdf......Page 504 |
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2014-12-11 08:18:11, 5.21 M
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