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[资源] 高分子聚合物的XPS及静态SIMS表面分析（英文版）

Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)

简介：
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
It is interesting to note that when this monograph was first contemplated, I had
two relevant titles from the Cambridge Solid Science Series on my bookshelves:
Polymer Surfaces by Cherry (now out of print) and Modern Techniques of
Surface Science by Woodruff and Delchar. The former does not discuss surface
analysis techniques whilst the latter does not mention application to polymers!
The behaviour of polymer surfaces is important in many technologies and
understanding this behaviour requires surface characterisation with a high
degree of chemical specificity, in terms of composition and structure, for species
covering a wide range of molecular weight. The application of X-ray photoelectron
spectroscopy (XPS or ESCA) and, later, static secondary ion mass spectrometry
(SSIMS), in the early stages of the development of the techniques, to polymer
surface analysis surely count as major successes. The requirements for polymer
surface analysis have continued to be important drivers in the evolution of
instrumental capabilities, because of the importance of this materials sector.
There is evidence that the polymer surface analysis field is now consolidating,
following a period of major developments in instrumentation, spectroscopic performance
and spectral interpretation. Spectral databases have been published,
application oriented papers outweigh fundamental papers in the literature and
instrument performance appears to have reached a plateau. The relative
strengths of XPS and SSIMS are widely appreciated and there are many available
reviews which cover, in more or less detail, the application of either technique,
separately. It is clear, however, that most polymer surface studies benefit from
the combined use of XPS and SSIMS, particularly now that time-of-flight
(ToF)SIMS instruments are becoming more widely available.
目录：
Chapter 1 Introduction 1
Chapter 2 XPS 14
Chapter 3 Information from polymer XPS 47
Chapter 4 Static SIMS (SSIMS) 88
Chapter 5 Information from SSIMS 119
Chapter 6 Polymer surface analysis case studies 156

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附件 1 : Surface_Analysis_of_Polymers_by_XPS_and_Static_SIMS_(Cambridge_Solid_State_Science_Series).pdf

2014-11-27 09:29:26, 8.03 M