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[资源] Small最新综述：石墨烯的低压透射电镜

本综述详细介绍了像差校正透射电子显微镜及其相关sp2碳，石墨烯转移及清洁方法，专门样品的制备，石墨烯的表征（原子分辨率成像，电子衍射，原子分辨光谱），电子束驱动的研究，基于电流的研究，碳管的原位研究，以及其他的二维材料。对石墨烯的研究起到了积极的推动作用。
Low Voltage Transmission Electron Microscopy of Graphene 共28页引文139篇
Alicja Bachmatiuk, Jiong Zhao, Sandeep Madhukar Gorantla, Ignacio Guillermo Gonzalez Martinez, Jerzy Wiedermann, Changgu Lee, Juergen Eckert, and Mark Hermann Rummeli*
The initial isolation of graphene in 2004 spawned massive interest in this two-dimensional pure sp2 carbon structure due to its incredible electrical, optical, mechanical, and thermal effects. This in turn led to the rapid development of various characterization tools for graphene. Examples include Raman spectroscopy and scanning tunneling microscopy. However, the one tool with the greatest prowess for characterizing and studying graphene is the transmission electron microscope. State-of-the-art (scanning) transmission electron microscopes enable one to image graphene with atomic resolution, and also to conduct various other characterizations simultaneously. The advent of aberration correctors was timely in that it allowed transmission electron microscopes to operate with reduced acceleration voltages, so that damage to graphene is avoided while still providing atomic resolution. In this comprehensive review, a brief introduction is provided to the technical aspects of transmission electron microscopes relevant to graphene. The reader is then introduced to different specimen preparation techniques for graphene. The different characterization approaches in both transmission electron microscopy and scanning transmission electron microscopy are then discussed, along with the different aspects of electron diffraction and electron energy loss spectroscopy. The use of graphene for other electron microscopy approaches such as in-situ investigations is also presented.请小伙伴们下载后给个好评！

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