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[求助]
求大神帮忙翻译一下这两句，谢谢啦
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The thin foils for transmission electron microscope (TEM) and high resolution transmission electron microscopy (HRTEM) examinations were prepared from the cut slices perpendicular to the Crystal/Substrate (C/S) interface with a thickness less than 80 μm before ion beam thinned using a Gatan precision ion polishing system (PIPS) at 5.0 kV and an incident angle of 4–6. Conventional TEM, HRTEM and Energy-dispersive X-ray spectroscopy (EDS) analyses were conducted on a Tecnai G2 F20 S-twin TEM instrument operated at an accelerating voltage of 200 kV. |
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