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[资源] 纳米材料与技术中的扫描探针显微分析：第三卷

纳米材料与技术中的扫描探针显微分析：第三卷，论坛中有第一和第二卷，这是2013刚出的第三卷
以下链接是第一卷，2011年出的
http://muchong.com/bbs/viewthread.php?tid=3954506&fpage=1&target=blank
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Table of contents :

Content:
Front Matter....Pages i-xx
Front Matter....Pages 1-1
Laser-Assisted Scanning Probe Alloying Nanolithography (LASPAN)....Pages 3-21
Characterization and Optimization of Quartz Tuning Fork-Based Force Sensors for Combined STM/AFM....Pages 23-53
Exploring Mesoscale Contact Mechanics by Atomic Force Microscopy....Pages 55-75
Front Matter....Pages 77-77
Atomic Force Microscopy for DNA SNP Identification....Pages 79-98
Atomic Force Microscopy of Isolated Nanostructures: Biomolecular Imaging in Hydrated Environments – Status and Future Prospects....Pages 99-135
Single-Molecule Studies of Integrins by AFM-Based Force Spectroscopy on Living Cells....Pages 137-169
Nanomechanics of Yeast Surfaces Revealed by AFM....Pages 171-193
Recent Developments in In Situ SFM of Block Copolymers: 3D Volume Structures and Dynamics....Pages 195-233
Surface Morphology and Crystallinity of Polyamides Investigated by Atomic Force Microscopy....Pages 235-247
Application of Atomic Force Microscopy in Natural Polymers....Pages 249-290
Investigation of Nanopatterned Functional Polymer Surfaces by AFM in Pulsed Force Mode....Pages 291-315
Reconstruction of Energy Surfaces from Friction Force Microscopy Measurements with the Jarzynski Equality....Pages 317-334
Contact and Friction of One- and Two-Dimensional Nanostructures....Pages 335-361
Van der Waals and Capillary Adhesion of Polycrystalline Silicon Micromachined Surfaces....Pages 363-393
Front Matter....Pages 395-395
Atomic Force Microscopy in Bioengineering Applications....Pages 397-430
Bridging Nano- and Microtribology in Mechanical and Biomolecular Layers....Pages 431-483
Thin Films for Thermoelectric Applications....Pages 485-528
Evaluation of the Nanoimprinting Process Using Scanning Probe Microscopy (SPM)....Pages 529-550
Electrical Characterization of Solar Cell Materials Using Scanning Probe Microscopy....Pages 551-573
Solid-State Thin-Film Lithium Batteries for Integration in Microsystems....Pages 575-619
Back Matter....Pages 621-630

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附件 1 : Scanning_Probe_Microscopy_in_Nanoscience_and_Nanotechnology.pdf

2014-11-05 09:04:49, 21.76 M