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纳米薄膜分析:Fundamentals of Nanoscale Film Analysis--Springer 2007
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Fundamentals of Nanoscale Film Analysis 正如该书前言中所说的：“This book focuses on the physics underlying the techniques used to analyze the surface region of materials. This book also addresses the fundamentals of these processes.”这是一本介绍表面分析技术的不错书籍，它从基本的原理说起，然后介绍了具体的分析方法，其实这些方法不仅用于膜材料的分析，还广泛的应用于其它纳米材料的分析。 By Terry L Alford, L.C. Feldman, James W. Mayer Publisher: Springer Number Of Pages: 330 Publication Date: 2007-02-16 1. An Overview: Concepts, Units, and the Bohr Atom ............................. 1 1.1 Introduction ..................................................................... 1 1.2 Nomenclature ................................................................... 2 1.3 Energies, Units, and Particles ................................................ 6 1.4 Particle–Wave Duality and Lattice Spacing ............................... 8 1.5 The Bohr Model................................................................ 9 Problems.................................................................................. 10 2. Atomic Collisions and Backscattering Spectrometry ............................ 12 2.1 Introduction ..................................................................... 12 2.2 Kinematics of Elastic Collisions ............................................ 13 2.3 Rutherford Backscattering Spectrometry .................................. 16 2.4 Scattering Cross Section and Impact Parameter.......................... 17 2.5 Central Force Scattering ...................................................... 18 2.6 Scattering Cross Section: Two-Body ....................................... 21 2.7 Deviations from Rutherford Scattering at Low and High Energy..... 23 2.8 Low-Energy Ion Scattering................................................... 24 2.9 Forward Recoil Spectrometry................................................ 28 2.10 Center of Mass to Laboratory Transformation............................ 28 Problems.................................................................................. 31 3. Energy Loss of Light Ions and Backscattering Depth Profiles ................. 34 3.1 Introduction ..................................................................... 34 3.2 General Picture of Energy Loss and Units of Energy Loss............. 34 3.3 Energy Loss of MeV Light Ions in Solids ................................. 35 3.4 Energy Loss in Compounds—Bragg’s Rule............................... 40 3.5 The Energy Width in Backscattering ....................................... 40 3.6 The Shape of the Backscattering Spectrum ............................... 43 3.7 Depth Profiles with Rutherford Scattering................................. 45 3.8 Depth Resolution and Energy-Loss Straggling ........................... 47 viii Contents 3.9 Hydrogen and Deuterium Depth Profiles .................................. 50 3.10 Ranges of H and He Ions ..................................................... 52 3.11 Sputtering and Limits to Sensitivity ........................................ 54 3.12 Summary of Scattering Relations ........................................... 55 Problems.................................................................................. 55 4. Sputter Depth Profiles and Secondary Ion Mass Spectroscopy ................ 59 4.1 Introduction ..................................................................... 59 4.2 Sputtering by Ion Bombardment—General Concepts................... 60 4.3 Nuclear Energy Loss .......................................................... 63 4.4 Sputtering Yield ................................................................ 67 4.5 Secondary Ion Mass Spectroscopy (SIMS)................................ 69 4.6 Secondary Neutral Mass Spectroscopy (SNMS)......................... 73 4.7 Preferential Sputtering and Depth Profiles ................................ 75 4.8 Interface Broadening and Ion Mixing ...................................... 77 4.9 Thomas–Fermi Statistical Model of the Atom............................ 80 Problems.................................................................................. 81 5. Ion Channeling .......................................................................... 84 5.1 Introduction ..................................................................... 84 5.2 Channeling in Single Crystals ............................................... 84 5.3 Lattice Location of Impurities in Crystals ................................. 88 5.4 Channeling Flux Distributions............................................... 89 5.5 Surface Interaction via a Two-Atom Model............................... 92 5.6 The Surface Peak............................................................... 95 5.7 Substrate Shadowing: Epitaxial Au on Ag(111).......................... 97 5.8 Epitaxial Growth ............................................................... 99 5.9 Thin Film Analysis 6. Electron–Electron Interactions and the Depth Sensitivity of Electron Spectroscopies ............................................................... 105 7. X-ray Diffraction........................................................................ 129 8. Electron Diffraction .................................................................... 152 9. Photon Absorption in Solids and EXAFS.......................................... 174 10. X-ray Photoelectron Spectroscopy .................................................. 11. Radiative Transitions and the Electron Microprobe.............................. 12. Nonradiative Transitions and Auger Electron Spectroscopy.................... 13. Nuclear Techniques: Activation Analysis and Prompt Radiation Analysis .. 14. Scanning Probe Microscopy.......................................................... http://mihd.net/v8pm47 其它材料书籍： Wiley2007年出版纳米领域权威综述及前瞻性书 http://www.muchong.com/bbs/viewthread.php?tid=789435 环境经典书籍：Environmental Applications of Nanomaterials http://www.muchong.com/bbs/viewthread.php?tid=780745 |
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