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Xie Wanfeng, Yan Jinliang, Liu Yu, Xue Yafei, Zhang Yijun, Zhang Fangfang, Wang Cong. Influnence of the substrate and thickness of HMVF layers on performance of NbSiN/NbSiNO/Si3N4 tandem. Acta Energiae Solaris Sinica, 2014, 35(1): 145-148. |
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151637: ½ð±Ò+5, ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸ 2014-09-18 11:52:28
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151637: ½ð±Ò+5, ¡ï¡ï¡ï¡ï¡ï×î¼Ñ´ð°¸ 2014-09-18 11:52:28
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Accession number: 20141017420081 Title: Influnence of the substrate and thickness of HMVF layers on performance of NbSiN/NbSiNO/Si3N4 tandem Authors: Xie, Wanfeng1, 2; Yan, Jinliang1; Liu, Yu2; Xue, Yafei2; Zhang, Yijun1; Zhang, Fangfang2; Wang, Cong2 Email author congwang@buaa.edu.cn Author affiliation: 1 College of Physics, Ludong University, Yantai 264025, China 2 Center of Condensed Matter and Material Physics, Beihang University, Beijing 100191, China Corresponding author: Wang, C. (congwang@buaa.edu.cn) Source title: Taiyangneng Xuebao/Acta Energiae Solaris Sinica Abbreviated source title: Taiyangneng Xuebao Volume: 35 Issue: 1 Issue date: January 2014 Publication year: 2014 Pages: 145-148 Language: Chinese ISSN: 02540096 CODEN: TYNPDG Document type: Journal article (JA) Publisher: Science Press, 18,Shuangqing Street,Haidian, Beijing, 100085, China Abstract: NbSiN/NbSiNO/Si3N4 and Mo/NbSiN/NbSiNO/Si3N4 multilayer Films were deposited on single-sided polishing stainless steel and Cu substrates by a reactive magnetron sputtering system. Four Nb chips (99.95%, ¦µ60 mm¡Á3 mm) were put on the polysilicon target. The thickness and optical performance were investigated by DEKTAK IIA X-step, UVPC3100 spectrophoto-meter and EXCALIBUR FTS 3000 Fourier Transform Infrared Spectrophotometer (FTIR). It was found that a high solar absorptance (0.90) and low emittance (0.12) on Cu substrate has been obtained. Infrared reflectance is relatively high when Mo layer thickness is 230 nm at>2.5 ¦Ìm of wavelength. The surfaces exhibits high absorptance ¦Á=0.95 and emittance ¦¥=0.33 when high metal fraction volume (HMVF) layer thickness is about 80 nm. The coating remains stable in vacuum up to 600¡ãC for 20 hours. Number of references: 14 Main heading: Fourier transform infrared spectroscopy Controlled terms: Magnetron sputtering - Multilayer films - Optical properties - Solar energy Uncontrolled terms: Absorptance - Emittances - Fourier transform infrared spectrophotometers - Infrared reflectance - Optical performance - Reactive magnetron sputtering - Solar absorptance - Spectrally selective Classification code: 615.2 Solar Power - 715.1 Electronic Equipment, non-communication - 741.1 Light/Optics - 801 Chemistry - 813.2 Coating Materials Database: Compendex Compilation and indexing terms, © 2014 Elsevier Inc. |
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