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ÎÒÃÇʵÑéÊÒÓÐ,µ«ÊÇÎÒ²»»áÓÃ. ÒòΪÎÒÒ²²»ÔõôÓÃÄǸöÒÇÆ÷. X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology. XRF in chemical analysis The use of a primary X-ray beam to excite fluorescent radiation from the sample was first proposed by Glocker and Schreiber in 1928[1]. Today, the method is used as a non-destructive analytical technique, and as a process control tool in many extractive and processing industries. In principle, the lightest element that can be analysed is beryllium (Z = 4), but due to instrumental limitations and low x-ray yields for the light elements, it is often difficult to quantify elements lighter than sodium (Z = 11), unless background corrections and very comprehensive interelement corrections are made. |
7Â¥2008-04-12 17:15:19
infinityppp
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2Â¥2008-04-06 15:10:08
zds1301
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X-ÉäÏßÓ«¹â·ÖÎö£¨X-ray Fluorescence Spectrometer£©£ºÔªËØ·ÖÎö£¨°Ù·Öº¬Á¿: wt% , mol %£© ²âÁ¿·¶Î§£º 5B¡«92U £¬ ¼´Ô×ÓÐòÊý5£92 ²âÁ¿¾«¶È£º ¿É´ïPPM¼¶ |
3Â¥2008-04-06 19:07:40
lina1981
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