| 查看: 798 | 回复: 16 | ||
| 【奖励】 本帖被评价15次，作者chem1983增加金币 13.5 个 | ||
| 当前主题已经存档。 | ||
| 当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖 | ||
[资源]
Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films
|
||
|
Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) By Charles Evans, Richard Brundle, Wilson Publisher: Butterworth-Heinemann Number Of Pages: 800 Publication Date: 1992-08-18 ISBN-10 / ASIN: 0750691689 ISBN-13 / EAN: 9780750691680 Binding: Hardcover Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities. Summary: Materials Characterization Overview Rating: 4 I purchased the book to help me better understand materials characterization for semiconductors. The book covers 50 materials characterization techniques, each of which is summarized in a single page at the beginning of the book. The book is then divided chapter by chapter for imaging techniques, electron beam instruments, diffractions, electron/x ray emission, visible, vibrational spectroscopies, ion scattering and mass spectroscopies, each written by an expert in the field. Although the chapters follow a similar format, some of them lack important aspects of characterization: Some chapter may not give adequate examples of a typical spectra, or others may be short on instrumentation. Because of the limit of space given for each characterization method, the authors had to balance width with depth, and the scale sometimes tipped to width. Notwithstanding the shortcomings of the book, it has been extremely useful to understand the basics of each characterization method, thus I gave it a 4 star rating. I am also reading a related book "Scanning Electron Microscopy and X ray Microanalysis" by Goldstein, a book on SEM related techniques, and finding that the book has excellent width and depth, and very clear in its presentation 下载地址 http://mihd.net/7vjmhf http://rapidshare.com/files/9681 ... terization_muya.rar  |
回复此楼» 猜你喜欢
283求调剂 086004考英二数二
已经有10人回复
-
22408 327分求调剂
已经有3人回复
-
0831生医工第一轮调剂失败求助
已经有12人回复
-
机械专硕270求调剂，接受跨专业
已经有12人回复
-
288求调剂
已经有15人回复
-
293求调剂
已经有5人回复
-
271求调剂
已经有5人回复
-
一志愿哈工大 085600 277 12材科基求调剂
已经有19人回复
-
272分材料子求调剂
已经有38人回复
-
电气工程专硕320求调剂
已经有3人回复
7楼2008-06-09 14:23:17
2楼2008-03-07 17:21:35
6楼2008-06-09 11:08:39
简单回复
zhbipi3楼
2008-03-07 18:42
回复
