| 查看: 1345 | 回复: 10 | ||
| 【奖励】 本帖被评价9次，作者学员2bQ2PZ增加金币 9 个 | ||
| 当前主题已经存档。 | ||
[资源]
2008新书：Applied Scanning Probe Methods IX: Characterization
|
||
|
Applied Scanning Probe Methods IX: Characterization (NanoScience and Technology) By Bharat Bhushan, Harald Fuchs, Masahiko Tomitori * Publisher: Springer * Number Of Pages: 387 * Publication Date: 2008-02 * ISBN-10 / ASIN: 3540740821 * ISBN-13 / EAN: 9783540740827 * Binding: Hardcover Book Description: The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. password: twilightzone http://rapidshare.com/files/86030476/EBC_ew4iTuX9.rar.html |
回复此楼» 猜你喜欢
金属材料论文润色/翻译怎么收费?
已经有93人回复
2楼2008-01-24 18:54:02
4楼2008-01-25 09:30:14
5楼2008-01-25 18:43:42
6楼2008-02-05 09:53:50
10楼2008-02-13 21:22:50
简单回复
2008-01-25 01:25
回复
amos07117楼
2008-02-05 11:42
回复
谢谢分享。
wuyq65028楼
2008-02-05 16:41
回复
2008-02-08 21:34
回复
