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Sheldrick, G. M., SHELXTL 5, 1995. The Complete Software Package for Single Crystal Structure Determination, Siemens, AG, Analytical Systems Aut37, D76181 Karlsruhe 21, Germany. 页码？ Sheldrick, G. M., SHELXTL 97, 1997. Program for Crystal Structure Refinement, University of Gottingen, Germany. ？ Sheldrick, G. M., 1996. SHELXTL, υ5 Reference Manual, Siemens Analytical X-ray Systems, Inc., Wisconsin, USA.？ |
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