| ²é¿´: 213 | »Ø¸´: 1 | |||
| µ±Ç°Ö÷ÌâÒѾ´æµµ¡£ | |||
netpigľ³æ (ÕýʽдÊÖ)
|
[½»Á÷]
²ÄÁϱíÕ÷µÄ¼¼ÊõµÄË÷Òý£¬³¬È«£¡
|
||
|
TECHNIQUES FOR MATERIALS CHARACTERIZATION EXPERIMENTAL TECHNIQUES USED TO DETERMINE THE COMPOSITION, STRUCTURE, AND ENERGY STATES OF SOLIDS AND LIQUIDS The many experimental methods, originally designed to study the chemical and physical behavior of solids and liquids, have grown into a new field known as Materials Characterization (or Materials Analysis). During the past 30 years a host of techniques aimed at the study of surfaces and thin films has been added to the many tools for the analysis of bulk samples. The field has benefitted particularly from the development of computers and microprocessors, which have vastly increased the speed and accuracy of the measuring devices and the recording of their output. Materials characterization was and is a very important tool in the search for new physical and chemical phenomena. It plays an essential role in new applications of solids and liquids in industry, communications, and medicine. Many of its techniques are used in quality control, in safety regulations, and in the fight against pollution. In most Materials Characterization experiments the sample is subjected to some kind of radiation: electromagnetic, acoustic, thermal, or particles (electrons, ions, neutrons, etc.). The surface analysis techniques usually require a high vacuum. As a result of interactions between the solid (or liquid) and the incoming radiation a beam of a similar (or a different) nature will emerge from the sample. Measurement of the physical and/or chemical attributes of this emerging radiation will yield qualitative, and often quantitative, information about the composition and the properties of the material being probed. The modern tendency of describing practically everything in this world by a combination of a few letters (acronyms) has also penetrated the field of Materials Characterization. The table below gives the meaning of the acronym for every technique listed, the form and size of the required sample (bulk, surface, film, liquid, powder, etc.), the nature of the incoming and of the emerging radiation, the depth and the lateral spatial resolution that can be probed, and the information obtained from the experiment. The last column lists one or two major references to the technique described. |
» ²ÂÄãϲ»¶
295·ÖÇóµ÷¼Á
ÒѾÓÐ12È˻ظ´
µ÷¼ÁÇóÊÕÁô
ÒѾÓÐ25È˻ظ´
272·Ö²ÄÁÏ×ÓÇóµ÷¼Á
ÒѾÓÐ49È˻ظ´
211±¾¿Æ²ÄÁÏ»¯¹¤Çóµ÷¼Á
ÒѾÓÐ16È˻ظ´
279ѧ˶ʳƷרҵÇóµ÷¼ÁԺУ
ÒѾÓÐ12È˻ظ´
һ־Ը˫·Ç085400µç×ÓÐÅÏ¢344 Çóµ÷¼Á£¬¶Ô²ÄÁϺͻ¯Ñ§·½ÏòÒ²¸ÐÐËȤ
ÒѾÓÐ11È˻ظ´
279Çóµ÷¼Á
ÒѾÓÐ8È˻ظ´
277Çóµ÷¼Á
ÒѾÓÐ21È˻ظ´
290Çóµ÷¼Á
ÒѾÓÐ15È˻ظ´
µ÷¼Á
ÒѾÓÐ26È˻ظ´
» ±¾Ö÷ÌâÏà¹ØÉ̼ÒÍÆ¼ö: (ÎÒÒ²ÒªÔÚÕâÀïÍÆ¹ã)
coatedconductor
ľ³æ (СÓÐÃûÆø)
»ÃÏëÊÀ½ç½¨Ôìʦ
- Ó¦Öú: 0 (Ó×¶ùÔ°)
- ½ð±Ò: 706.2
- Ìû×Ó: 225
- ÔÚÏß: 111.1Сʱ
- ³æºÅ: 318130
- ×¢²á: 2007-03-05
- רҵ: ÎÞ»ú·Ç½ðÊôÀà¸ß㬵¼Óë´Å

2Â¥2008-02-14 12:57:01













»Ø¸´´ËÂ¥