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han211225木虫 (正式写手)
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求助：钛及其合金的残余应力测定
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| 各位前辈有做过的钛及其合金的残余应力测定介绍一下经验。最近想做钛及其合金的近表残余应力分布，尝试了铜靶，铬靶但峰形很差无法解析，且背底很高。那位做过介绍一下经验。谢谢。 |
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2楼2007-11-27 03:52:29
han211225
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3楼2007-11-27 15:31:47
han211225
木虫 (正式写手)
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The residual stress was characterized by X-ray diffraction analysis using a parallel inclination method. The Cu tube was used to generate X-rays. Operated voltage and current were 30 kV and 10 mA, respectively. The solar slit angle and width were 1 and 4 mm, respectively. The specimen was covered with a mask of 3 mm in width and 5 mm in length. The diffractive X-rays were counted for 10 s at each 0.2_ step using a scintillation counter through Ni filter at angles w . 0, 10, 20, 30, 40, 50_. Here, w is the angle between the normal to the specimen surface and the normal to the diffractive face. The diffractive plane was the (3 0 2) plane of Ti–6Al–4V, the diffractive angle 2h without strain was 148.4_ and the stress factor of X-ray diffraction analysis was -231.7 MPa/ degree. The diffractive angle was determined by a half value width method. The residual stress was calculated by a sin2 w method, i.e., the gradient of the line from the six points on the 2h _ sin2 w diagram using a least square method. 此文中的这一句The specimen was covered with a mask of 3 mm in width and 5 mm in length. 是什莫目的？ |
4楼2007-11-27 22:07:41
