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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization By Dieter K. Schroder * Publisher: Wiley-IEEE Press * Number Of Pages: 800 * Publication Date: 2006-01-30 * Sales Rank: 211190 * ISBN / ASIN: 0471739065 * EAN: 9780471739067 * Binding: Hardcover * Manufacturer: Wiley-IEEE Press * Studio: Wiley-IEEE Press * Average Rating: 5 * Total Reviews: 3 Book Description: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: * Updated and revised figures and examples reflecting the most current data and information * 260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. * Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. link: http://rapidshare.com/files/6390 ... tion_0471739065.rar pass: gigapedia.org |
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★★★ 三星级,支持鼓励
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谢谢共享 看见好多人询问怎么有密码，我怎么下载不了。其实这些都是共享站点，很容易使用，但你要知道他的规则，比如Rapidshare不支持多线程，你就不能使用迅雷多线程下载等。 所以只要你知道他们的下载规则，你就知道怎么下载了。 我做了一个Rapidshare、Mihd、Live-share等网盘的下载图解教程，不知道怎么下载的朋友可以到那里学习 http://muchong.com/bbs/viewthread.php?tid=591515&fpage=1 |
8楼2007-10-21 15:24:29
★★★★★ 五星级,优秀推荐
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http://mihd.net/jlr8ag pass: gigapedia.org [ Last edited by hamhys on 2007-10-22 at 19:35 ] |
4楼2007-10-21 09:28:10
5楼2007-10-21 13:01:36
6楼2007-10-21 13:23:08