| 查看: 2944 | 回复: 30 | ||
| 【奖励】 本帖被评价25次，作者zhangjs增加金币 23 个 | ||
| 当前主题已经存档。 | ||
| 当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖 | ||
[资源]
Semiconductor Material and Device Characterization
|
||
|
Semiconductor Material and Device Characterization By Dieter K. Schroder * Publisher: Wiley-IEEE Press * Number Of Pages: 800 * Publication Date: 2006-01-30 * Sales Rank: 211190 * ISBN / ASIN: 0471739065 * EAN: 9780471739067 * Binding: Hardcover * Manufacturer: Wiley-IEEE Press * Studio: Wiley-IEEE Press * Average Rating: 5 * Total Reviews: 3 Book Description: This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: * Updated and revised figures and examples reflecting the most current data and information * 260 new references offering access to the latest research and discussions in specialized topics * New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: * Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. * Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department. link: http://rapidshare.com/files/6390 ... tion_0471739065.rar pass: gigapedia.org |
回复此楼» 猜你喜欢
293求调剂
已经有12人回复
-
一志愿中南大学 0855 机械 286 求调剂
已经有7人回复
-
化学070300 求调剂
已经有11人回复
-
346分，工科0854求调剂，专硕
已经有6人回复
-
化工学硕294分，求导师收留
已经有3人回复
-
297工科，求调剂?
已经有7人回复
-
一志愿085802 323分求调剂
已经有11人回复
-
山东双非院校考核超级无底线，领导幸灾乐祸，教师遭殃恐
已经有7人回复
-
279学硕食品专业求调剂院校
已经有17人回复
-
一志愿安大生物学07初试322、本科二本、调剂求助
已经有9人回复
20楼2007-10-22 21:31:49
★★★★★ 五星级,优秀推荐
|
http://mihd.net/jlr8ag pass: gigapedia.org [ Last edited by hamhys on 2007-10-22 at 19:35 ] |
4楼2007-10-21 09:28:10
5楼2007-10-21 13:01:36
6楼2007-10-21 13:23:08
