A nanoscale combing technique for the large-scale
assembly of highly aligned nanowires
控制组装纳米线在 bottom-up devices 中是个关键的难题。本文基于nanocombing assembly technique实现了纳米线的大面积组装对齐。产生的这列率超过98.5% ,对齐误差1%。缺陷密度达到0.04 纳米线/um,把这种纳米线在芯片上制作成阵列,实现了可以重复的电学性质。[ Last edited by spriing2012 on 2013-5-24 at 15:36 ]