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The synthesized samples were characterized with a Philips Xray Diffractometer (PW 1830 + APD 3520) with Cu K radiation between 10◦ and 70◦ at a scan rate of 0.04◦/s. The microstructure and morphology of the samples were examined with a JEOL JSM- 5610 and a FEI Quanta 650 scanning electron microscope (SEM) and a JEOL JEM-2010F transmission electron microscope (TEM). The composition of the sulfur¨Ccarbon composite was also determined with an energy dispersive spectrometer (EDS) attached to the TEM instrument. |
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huangzx1314
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- Ó¦Öú: 86 (³õÖÐÉú)
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- ×¢²á: 2009-11-13
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The synthesized samples were characterized with a Philips Xray Diffractometer (PW 1830 + APD 3520) with Cu K radiation between 10◦ and 70◦ at a scan rate of 0.04◦/s. The microstructure and morphology of the samples were examined with a JEOL JSM- 5610 and a FEI Quanta 650 scanning electron microscope (SEM) and a JEOL JEM-2010F transmission electron microscope (TEM). The composition of the sulfur¨Ccarbon composite was also determined with an energy dispersive spectrometer (EDS) attached to the TEM instrument. ºÏ³ÉµÄÑùƷͨ¹ý·ÉÀûÆÖXÉäÏßÑÜÉäÒÇ£¨ÐͺţºPW 1830 + APD 3520£©±íÕ÷£¬Ê¹ÓÃͰÐK¦ÁÉäÏßÔÚ10¡ã~70¡ãÖ®¼äÒÔ0.04¡ãµÄ²½³¤²âÁ¿¡£ÊÔÑùµÄ΢¹Û½á¹¹ÓëÐÎòͨ¹ýÐͺÅΪJEOL JSM- 5610ºÍFEI Quanta 650µÄɨÃèµç¾µ½øÐÐÒÔ¼°ÐͺÅΪJEOL JEM-2010FµÄ͸Éäµç¾µ±íÕ÷¡£Áò̼¸´ºÏ²ÄÁϵÄÔªËØ×é³Éͨ¹ý͸Éäµç¾µµÄ¸¨ÖúÉ豸ÄÜÆ×ÒǽøÐвâÊÔ¡£ |
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