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The Art of SPM: Scanning Probe Microscopy in Materials Science
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 Progress Report The Art of SPM: Scanning Probe Microscopy in Materials Science J. Loos * Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, PO Box 513, NL-5600 MB Eindhoven, The Netherlands email: J. Loos (j.loos@tue.nl) *Correspondence to J. Loos, Department of Chemical Engineering and Chemistry, Eindhoven University of Technology, PO Box 513, NL-5600 MB Eindhoven, The Netherlands Keywords Scanning probe microscopy Abstract In this Progress Report, outstanding scientific applications of scanning probe microscopy (SPM) in the field of materials science and the latest technique developments are introduced and discussed. Besides being able to image the organization of matter with sub-nanometer resolution, SPM, owing to its basic operating principle, provides the power to measure, analyze, and even quantify properties of matter on the nanometer length scale. Moreover, because of its unique potential to manipulate the organization of atoms, molecules, assemblies, or particles and to structure surfaces in a controlled fashion, in the fields of nanoscience and nanotechnology SPM has become one of the most powerful tools for preparation and analysis of nanostructures and their functionality. Because of the tremendous variety of its applications, only selected - but subjectively exceptional - topics are considered in this Progress Report, showing the full potential of SPM. Advanced Materials, Volume 17, Issue 15 , Pages 1821 - 1833(2005) [search]The Art of SPM: Scanning Probe Microscopy in Ma ...[/search] |
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