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XPS analyseswere performed with a V.G. Scientific ESCALAB250 using focused (diameter of the irradiated area was approximately 500m) monochromated Al K (h = 1486.6 eV, 150W). An electron shower was used in order to compensate for charging effects. Ahemispherical electrostatic analyzer and a LargeAreaXL Lenswere used tomaximize the signal. The residual pressure inside the analysis chamber was 6¡Á10−10 mbar. The spectrometer was calibrated using the photoemission lines of Au (Au 4f7/2 = 83.95 eV), Ag (Ag 3d5/2 = 368.22 eV) and Cu (Cu 2p3/2 = 932.62 eV). The peaks were recorded at a constant pass energy of 20 eV and XPS datawere taken at normal emission ( =0◦ for all catalysts. No smoothing routineof data was applied to the data during the analysis. Atomic ratios were then computed from the intensity ratios normalized by the atomic sensitivity factors of Scofield [6]. A Shirley-type background subtraction was done prior to curve fitting, and fitting the experimental curve to 80% Gaussian¨C20% Lorentzian function. In addition, aminimum number of doubletswere always used in order to fit the experimental curves. W. Huang et al. / Journal of Electron Spectroscopy and Related Phenomena 173 (2009) 88¨C95 |
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for all catalysts. No smoothing routine
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