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Nanotechnology & New Materials
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Nanotechnology is nowadays a popular topic in materials science. It has deserved this popularity because of its interdisciplinary character, involving expertise in physics, chemistry, biology and medicine. Many materials properties are studied in detail. Nanosized dimensions The common factor in nanotechnology is the lateral dimension, being in the nanometer (that is 1 billionth of a meter) range, of the structures studied. Atomic or molecular distances, sizes of structures in semiconductor devices and grain sizes in nanopowders are just a few examples out of many that can be considered as nanosized dimensions. In nanotechnology, knowledge of the structure and composition of the materials studied is a key requirement for understanding materials properties at a small distance. Since the dimensions of X-ray wavelengths are in the same order as the sizes of nanostructures, X-ray diffraction is an important tool for the nanoscientist. An X-ray diffraction system should not be missing in a modern laboratory for research on nano- and advanced materials. Breakthroughs for diffraction X-ray diffraction can be used in many ways for the study of new materials, often only available in very small amounts. Recent breakthroughs in X-ray diffraction instrumental development, such as RTMS detection technology and the implementation of mono-capillary have reduced measurement times and minimum amounts of material required considerably. Many X-ray diffraction techniques are at disposal of the nanoscientist for the structural characterization of the nanomaterials, such as high-resolution diffraction, reflectometry, small-angle X-ray scattering and line profile analysis. PANalytical and nanotechnology PANalytical delivers a number of dedicated solutions for nanostructural problems. Highly perfect structures can be measured using the X'Pert PRO MRD with high-resolution optics. For polycrystalline nanomaterials, the X'Pert PRO MPD will demonstrate its applicability for e.g. line profile analysis, whereas suspended nanopowders can be best characterized using a small-angle X-ray scattering system such as the SAXSess. http://www.panalytical.com/index.cfm?sid=206&pid=533 |
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