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题目 Storage reliability evaluation of electronic equipment from accelerated degradation testing 最好能详细一些把网页截下，谢谢 |
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rockinuk
铁杆木虫 (职业作家)
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【答案】应助回帖
感谢参与，应助指数 +1
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Storage reliability evaluation of electronic equipment from accelerated degradation testing Xuecheng Zhang (Mil. Representative Office in Shanghai, Shanghai, China); Jingrun Ma; Jingsheng Hu; Jingjing Gong Source: 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), p 859-62, 2012 Database: Inspec ------------------------------------------- Check record to add to Selected Records 1. Accession number: 12882698 Title: Storage reliability evaluation of electronic equipment from accelerated degradation testing Authors: Xuecheng Zhang1 ; Jingrun Ma1; Jingsheng Hu1; Jingjing Gong2 Author affiliation: 1 Mil. Representative Office in Shanghai, Shanghai, China 2 Shanghai Aerosp. Electron. Technol. Inst., Shanghai, China Source: 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) Publication date: 2012 Pages: 859-62 Language: English ISBN-13: 978-1-4673-0786-4 Document type: Conference article (CA) Conference name: 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) Conference date: 15-18 June 2012 Conference location: Chengdu, China Sponsor: IEEE Reliability Soc. Publisher: IEEE Place of publication: Piscataway, NJ, USA Material Identity Number: YXB2-1901-406 Abstract: It is a challenge to evaluate the storage reliability of product with long lifetime and high reliability. Especially, it is very important for the weapon system such as missile which is in long-term storage and one-off use to research the storage reliability. The electronic equipment of such product is prone to fail over long period of storage time. The reliability of electronic equipment should be evaluated in order to adapt to traits of long-storage and usable at any moment. The accelerated degradation testing is utilized to evaluate the storage reliability of electronic equipment in this paper. First, the accelerated drift Brown motion model is established based on the fact that the accelerated degradation of electronic equipment obeys the rule of accelerated model and stochastic process. Second, the storage reliability evaluation model is generated combined with characteristics that the first passage time of linear drift Brown motion presents the inverse Gaussian distribution. In view of the fact that initial reliability of new product is not nicely 1, this model introduces the concept of initial failure. Then methods of maximum likelihood and least squares are used to estimate model parameters at unequal sampling interval. Finally, engineering application validates the proposed method effective. Number of references: 9 Inspec controlled terms: missiles - reliability - storage Uncontrolled terms: storage reliability evaluation - electronic equipment - accelerated degradation testing - long lifetime - high reliability - weapon system - missile - accelerated drift Brown motion model - passage time Inspec classification codes: B7910 Military circuits, components, and equipment - B0170N Reliability Treatment: Practical (PRA); Theoretical or Mathematical (THR) Discipline: Electrical/Electronic engineering (B) DOI: 10.1109/ICQR2MSE.2012.6246362 IPC Code: B65G1/00 SECTION B PERFORMING OPERATIONS; TRANSPORTING CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL TRANSPORT OR STORAGE DEVICES, e.g. CONVEYERS FOR LOADING OR TIPPING; SHOP CONVEYER SYSTEMS; PNEUMATIC TUBE CONVEYERS transport or storage devices used in a particular handling or treatment of... Storing articles, individually or in orderly arrangement, in warehouses or magazines conveyer combinations in warehouses, magazines, or workshops ; stacking of articles ; removing articles from... Database: Inspec Copyright 2012, The Institution of Engineering and Technology ==== 看见 Inspec 就不用查 EI 了~~去查查 ISTP 还可能比较有用~~==== |
2楼2012-08-25 11:30:31
rockinuk
铁杆木虫 (职业作家)
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3楼2012-08-25 11:32:52
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