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MRS Bulletin:Scanning Probe Microscopy in Materials Science
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 Scanning Probe Microscopy in Materials Science Volume 29, No. 7 Guest Editors: E. Meyer, S.P. Jarvis, and N.D. Spencer. We invite you to view the introductory article for this issue, "Scanning Probe Microscopy in Materials Science" by Ernst Meyer, Suzanne P. Jarvis, and Nicholas D. Spencer, Guest Editors. On the Cover | Masthead All visitors have access to the article abstracts. MRS Members (login for access) and those with institutional access may view the complete article by selecting the "View Paper" button beneath each article. (NOTE: "View Paper" will only appear for logged-in users with the appropriate access.) Non-Members can purchase individual articles by selecting the "Purchase Paper" button beneath each article. Theme Article - Atomic Force Microscopy of Biological Samples P.L.T.M. Frederix, B.W. Hoogenboom, D. Fotiadis, D.J. Müller, and A. Engel Theme Article - Imaging, Manipulation, and Spectroscopic Measurements of Nanomagnets by Magnetic Force Microscopy Xiaobin Zhu and Peter Grütter Theme Article - The Application of Atomic Force Microscopy to the Characterization of Industrial Polymer Materials Georg K. Bar and Gregory F. Meyers Theme Article - Measurements of In-Plane Material Properties with Scanning Probe Microscopy Robert W. Carpick and Mark A. Eriksson Theme Article - Scanning Probe Microscopy Measurements of Friction Scott S. Perry Theme Article - Germanium Nanostructures on Silicon Observed by Scanning Probe Microscopy Masahiko Tomitori and Toyoko Arai http://www.box.net/shared/qltb4j1r8m |
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