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MRS Bulletin: Focused Ion Beam Microscopy and Micromachining
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May 2007 printer-friendly  Focused Ion Beam Microscopy and MicromachiningVolume 32, No. 5 BUY THIS ISSUE Guest Editors: Cynthia A. Volkert and Andrew M. Minor The recent availability of commercial focused ion beam (FIB) microscopes has rapidly led to widespread use in materials research. FIB instruments have both imaging and micromachining capabilities at the nanometer-to-micrometer scale; thus, a broad range of fundamental studies and technological applications have been enhanced or made possible by FIB technology. This issue highlights specific applications of the FIB in materials science, its particular strengths in sample preparation for transmission electron microscopy, and its potential for ion beam fabrication and prototyping. Also in this issue is the technical feature “Smart Nanotextiles: A Review of Materials and Applications,” by Coyle et al. This article outlines current research in nanotechnology application to fabrics, from fiber manipulation and development to the end uses of smart nanotextiles. On the Cover | Masthead All visitors have access to the article abstracts. MRS Members (login for access) and those with institutional access may view the complete article by selecting the "View Paper" button beneath each article. (NOTE: "View Paper" will only appear for logged-in users with the appropriate access.) Non-Members can purchase individual articles by selecting the "Purchase Paper" button beneath each article. Theme Article - Focused Ion Beam Microscopy and Micromachining Cynthia A. Volkert and Andrew M. Minor, Guest Editors Theme Article - TEM Sample Preparation and FIB-Induced Damage Joachim Mayer, Lucille A. Giannuzzi, Takeo Kamino, and Joseph Michael Theme Article - Three-Dimensional Microstructural Characterization Using Focused Ion Beam Tomography Michael D. Uchic, Lorenz Holzer, Beverley J. Inkson, Edward L. Principe, and Paul Munroe Theme Article - Focused Ion Beam Micro- and Nanoengineering Richard M. Langford, Philipp M. Nellen, Jacques Gierak, and Yongqi Fu Theme Article - Fundamentals of Focused Ion Beam Nanostructural Processing: Below, At, and Above the Surface Warren J. MoberlyChan, David P. Adams, Michael J. Aziz, Gerhard Hobler, and Thomas Schenkel Technical Feature - Smart Nanotextiles: A Review of Materials and Applications Shirley Coyle, Yanzhe Wu, King-Tong Lau, Danilo De Rossi, Gordon Wallace, and Dermot Diamond http://rapidshare.com/files/32579258/MR_Bulletin_32_5_2007.rar [ Last edited by memser on 2009-1-14 at 08:48 ] |
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