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介孔材料
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本人专业是材料，具体涉及介孔。因此对介孔材料从合成表征，到形成机理，到性能应用都很感兴趣。但是无奈自己资质愚钝，又不奋发，因而学识寡漏。本人发起这个主题，只能算是抛砖，希望引来各位介孔方面的能人施玉。 而从事介孔的，或是对介孔有兴趣的学术朋友汇集于此，共享资源，畅谈介孔，可谓快哉。 我还是以介孔方面出现的文献为内容，介绍介孔制备方面的发展： 1.介孔材料的诞生－－1992年MS41系列分子筛(典型的是MCM-41,MCM-48,MCM-50)的合成（严格来讲，应该是1991年日本人合成出来）： Nature. 1992, 359, 710-712（J. S. Beck） J Am Chem Soc. 1992, 114: 10834-10843（J. S. Beck） Science. 1993, 261: 1299-1303(霍启升） 2.介孔材料制备的另一里程碑－－1998年赵东元合成了SBA-15 Science. 1998, 279: 548-552（赵东元） J. Am. Chem. Soc. 1998, 120, 6024-6036 （赵东元） 3.通过硬模板法合成炭基介孔材料，也是一大重要成绩－－1999年由韩国人刘龙完成： J Am Chem Soc. 2002, 124: 1156-1157( Ryoo R.) [ Last edited by 604gq on 2008-3-26 at 15:02 ] |
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Structural Elucidation of Microporous and Mesoporous Catalysts and Molecular Sieves by High-Resolution Electron Microscopy JOHN MEURIG THOMAS, OSAMU TERASAKI, PRATIBHA L. GAI, WUZONG ZHOU,AND JOSE GONZALEZ-CALBET Acc. Chem. Res. 2001, 34, 583-594 ABSTRACT Twenty years ago, one of us embarked (Bursill, L. A.; Lodge, E. A.; Thomas, J. M. Zeolitic structures as revealed by high-resolution electron microscopy. Nature 1980, 286, 111-113) on the study of zeolites (renowned for their electron-beam sensitivity) by highresolution transmission electron microscopy (HRTEM). In the ensuing years, high-resolution imaging aided by optical diffractometry has yielded details of the open framework structures of anumber of new aluminosilicate and aluminophosphate molecular sieves and catalysts. The nature of intergrowth and recurrently twinned structures, as well as new types of structural imperfection in hitherto uncharacterized materials, has also been elucidated. With continued improvements in instrumental development, encompassing higher accelerating voltages, better objective lenses and vacua, computational advances, and the arrival of slow-scan CCD detectors, electron crystallographic methods and HRTEM imaging now enable the ab initio three-dimensional structures of micro- and mesoporous solids, with their occluded structuredirecting organic species, to be determined. High-resolution scanning transmission electron microscopy using subnanometric probes provides supplementary structural and ltramicro analytical information and electron spectroscopic imaging (at the attogram level). In its high-angle annular dark-field mode, it is capable of locating and determining the composition of individual nanoparticle catalysts (consisting of just a few atoms) supported on porous hosts. [ Last edited by temedx on 2007-5-4 at 19:30 ] |
35楼2007-05-04 19:13:32