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duzhichao
ľ³æ (СÓÐÃûÆø)
- ·ÒëEPI: 7
- Ó¦Öú: 31 (СѧÉú)
- ½ð±Ò: 2617.2
- É¢½ð: 47
- ºì»¨: 1
- Ìû×Ó: 295
- ÔÚÏß: 89.8Сʱ
- ³æºÅ: 1817367
- ×¢²á: 2012-05-15
- ÐÔ±ð: GG
- רҵ: »ùÒò×éѧ
¡ï ¡ï ¡ï ¡ï
keyousha: ½ð±Ò+5, ·ÒëEPI+1 2012-05-31 08:27:20
Mally89: ·ÒëEPI-1 2012-05-31 23:28:40
Mally89: ½ð±Ò-9, ÊÕ»ØBB£¡~ 2012-05-31 23:28:55
keyousha: ½ð±Ò+5, ·ÒëEPI+1 2012-05-31 08:27:20
Mally89: ·ÒëEPI-1 2012-05-31 23:28:40
Mally89: ½ð±Ò-9, ÊÕ»ØBB£¡~ 2012-05-31 23:28:55
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Abstract Electron microscopy and electron microscopy techniques of science and technology and the development of social productivity plays a huge role in promoting, it has been widely recognized by the global scientific community, the high-resolution transmission electron microscopy has become the highest test accuracy of nano-scale measurement tools. In this paper, the comparative study of the development of high-resolution electron microscopy and electronic microscopy image analysis methods for high-resolution transmission electron microscopy image of the algorithm in general can be divided into two categories: one is to detect the peak strength of the real space the peak point of the geometric phase of the algorithm, there is the Fourier space. In this paper, we introduce a real space approach, the peak point of the algorithm, which is the affine change based on the detection of the intensity maxima of the datum. Although this is a real-space algorithm, but the peak point of the algorithm is applicable to some defective parts. Therefore, this method is suitable for the strain field mapping graphics in real space. Geometric phase analysis is an analytical method based on transmission electron microscopy, high-precision nanoscale experimental mechanics, the measurement sensitivity can be achieved at the atomic level. By comparing the two different methods, can have a better understanding of electron microscopy image analysis methods. We believe that these two algorithms, and is useful in the determination of strain, both methods have their own different strengths and weaknesses in the process of electron microscopy image analysis, they should be regarded as two complementary tools. Key words: high-resolution transmission electron microscopy; image processing; geometric phase method¸Ð¾õºì°¡µÄ»°£¬¾ÍËͶ仨°É¡£²»Óøø½ð±Ò¡£ºÙºÙ |

2Â¥2012-05-30 22:12:49
keyousha
ͳæ (³õÈëÎÄ̳)
- Ó¦Öú: 0 (Ó×¶ùÔ°)
- ½ð±Ò: 180.4
- Ìû×Ó: 41
- ÔÚÏß: 30.3Сʱ
- ³æºÅ: 1269186
- ×¢²á: 2011-04-18
- ÐÔ±ð: GG
- רҵ: ¼ÆËã»úÓ¦Óü¼Êõ

3Â¥2012-05-31 00:34:34
duzhichao
ľ³æ (СÓÐÃûÆø)
- ·ÒëEPI: 7
- Ó¦Öú: 31 (СѧÉú)
- ½ð±Ò: 2617.2
- É¢½ð: 47
- ºì»¨: 1
- Ìû×Ó: 295
- ÔÚÏß: 89.8Сʱ
- ³æºÅ: 1817367
- ×¢²á: 2012-05-15
- ÐÔ±ð: GG
- רҵ: »ùÒò×éѧ

4Â¥2012-05-31 00:52:29














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