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[½»Á÷] New Magnetic Properties of Silicon/Silicon Oxide Interfaces**

By Gregory Kopnov, Zeev Vager, and Ron Naaman*

Adv. Mater. 2007, 19, 925¨C928


G. Kopnov 1, Z. Vager 2, R. Naaman 1 *
1Department of Chemical Physics, The Weizmann Institute of Sciences, Rehovot 76100, Israel
2Department of Particle Physics, The Weizmann Institute of Sciences, Rehovot 76100, Israel

email: R. Naaman (Ron.Naaman@weizmann.ac.il)

*Correspondence to R. Naaman, 1Department of Chemical Physics, The Weizmann Institute of Sciences, Rehovot 76100, Israel


We thank Prof. Itamar Procaccia for helpful discussions and suggestions regarding the structural function. We wish to thank Dr. Hagai Cohen for performing the XPS experiments and Dr. Yishay Feldman for the AFM work. We thank Dr. Sidney Cohen and Dr. Shirley Daube for critical reading of the manuscript and good advice. This study was partially supported by the Schmidt Minerva Center and the Nancy and Stephen Grand Center for Sensors and Security.

Funded by:
Schmidt Minerva Center
Nancy and Stephen Grand Center for Sensors and Security

Keywords
Interfaces ?Magnetic materials ?Silicon ?Spintronics ?Surface modification
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