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精品推荐－ebook Applied Scanning Probe Methods 丛书（整理IV－VI，补充III,II）
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更新补充II 整理论坛上已有的IV－VI卷，新补充第III卷，以前发的可能有的朋友没注意卷不同，所以整理出来，希望有权限的朋友把没有的卷也下来，这套书还是很不错的！ Series: NanoScience and Technology Author: Bharat Bhushan and Satoshi Kawata Publisher: Springer Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the first volume published in early 2004. The field is progressing so fast that there is a need for a second set of volumes to capture the latest developments. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. Volume II introduces scanning probe microscopy, including sensor technology, Volume III covers the whole range of characterization possibilities using SPM and Volume IV offers chapters on uses in various industrial applications. The international perspective offered in these three volumes - which belong together - contributes further to the evolution of SPM techniques. The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. [ Last edited by tangsd2 on 2007-4-7 at 23:35 ] |
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更正: Applied Scanning Probe Methods V: Scanning Probe Microscopy 补充新链接 http://www.box.net/public/xj77271stc pass code: www.nanost.netnanost应该是www.nanost.net |
7楼2007-03-12 12:06:36
2楼2007-03-10 13:09:13
3楼2007-03-10 13:18:41
5楼2007-03-12 08:26:35
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2007-03-14 16:25
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