| 查看: 1168 | 回复: 7 | ||
| 【奖励】 本帖被评价5次，作者guojjun增加金币 4 个 | ||
| 当前主题已经存档。 | ||
[资源]
Applied Scanning Probe Methods VI: Characterization
|
||
|
搜索无重复!!! ISBN: 3540373187 Title: Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology) Author: Bharat Bhushan and Satoshi Kawata Publisher: Springer Publication Date: 2006-11-10 Number Of Pages: 338  The volumes V, VI and VII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004 and the second to fourth volumes in early 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. http://rapidshare.com/files/1394 ... s.VI-3540373187.rar MiHD download (16.67 MB) >>> http://mihd.net/uflhpb 16.7 MB |
回复此楼
2楼2007-01-30 08:46:44
3楼2007-01-30 09:52:28
4楼2007-11-14 12:14:54
