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ISBN: 0849339286 Title: X-Ray Metrology in Semiconductor Manufacturing Author: D. Keith Bowen Brian K. Tanner Publisher: CRC Publication Date: 2006-01-24 Number Of Pages: 296 ![]() Book Description Written by established world experts, X-Ray Metrology in Semiconductor Manufacturing describes the applications, science, and technology of this rapidly evolving area. This book emphasizes practical metrology, with real world examples from the semiconductor and magnetics industries. The authors discuss the techniques, theory, and applications of X-ray metrology in semiconductors and other advanced thin films. The book covers the essential metrological questions of precision and repeatability, absolute accuracy, spot size, and throughput for each type of measurement. This text contains important information for electrical engineers, fabrication engineers, and semiconductor engineers. ISBN: 3540345221 Title: Special Relativity: Will it Survive the Next 101 Years? Author: J¨¹rgen Ehlers (Editor), Claus Lämmerzahl (Editor) Publisher: Springer Publication Date: 2006-10 Number Of Pages: 533 ![]() Book Description After a century of successes, physicists still feel the need to probe the limits of the validity of theories based on special relativity. Canonical approaches to quantum gravity, non-commutative geometry, string theory and unification scenarios predict tiny violations of Lorentz invariance at high energies. The present book, based on a recent seminar devoted to such frontier problems, contains reviews of the foundations of special relativity and the implications of Poincar¨¦ invariance as well as comprehensive accounts of experimental results and proposed tests. The book addresses, besides researchers in the field, everyone interested in the conceptual and empirical foundations of our knowledge about space, time and matter. ÔÚÕâ¸öÂÛ̳http://newbook.edu.topzj.com/¿´µ½µÄ£¬ºÜ²»´í°¡ |
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