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52chem银虫 (小有名气)
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Transmission Electron Microscopy of Semiconductor Nanostructures
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ISBN: 3540004149 Title: Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics) Author: Andreas Rosenauer Publisher: Springer Publication Date: 2003-04-28 Number Of Pages: 238 Average Amazon Rating: Editorial Description This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods including strain state analysis as well as evaluation of the composition via the lattice fringe analysis (CELFA) technique. The basics of these procedures as well as their advantages, drawbacks and ...read whole description http://www.bestsharing.com/ms001 ... Microscopy.pdf.html http://mihd.net/zw5a3m |
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