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52chem

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虫号: 281274
注册: 2006-09-23
专业: organic chemistry

[交流] Transmission Electron Microscopy of Semiconductor Nanostructures

ISBN: 3540004149
Title: Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics)
Author: Andreas Rosenauer
Publisher: Springer
Publication Date: 2003-04-28
Number Of Pages: 238
Average Amazon Rating:

Editorial Description
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods including strain state analysis as well as evaluation of the composition via the lattice fringe analysis (CELFA) technique. The basics of these procedures as well as their advantages, drawbacks and ...read whole description

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