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СµÜ±¾¿ÆÉú£¬Ñо¿ÄÉÃײÄÁϳ¡·¢É䣬¸úµ¼Ê¦Í¶ÁËһƪÂÛÎĵ½Electronics letter£¬Ò»¸öÔ±»¾Ü£¬ÓÐÉó¸åÒâ¼û£¨ÈçÏ£©£¬Ìý˵Õâ¸öletterÍ˸åºÜÉÙ¸øÒâ¼û¡£ ÇóÖú¸÷λ²»ÖªµÀ°´Éó¸åÒâ¼ûÐ޸ĺó£¬ÔÙͶÊÇ·ñÓÐÏ·¡£»òÕßתͶÆäËû£¿ÇóÖú£¡ÇóÖú£¡ The paper is clearly expressed, the principles are sound and the Letter shows a way of reducing damage by transient current. However, in the simulation plot of Fig. 2(b), the experimental rate of decay of current from the maxima at A and B appears much greater than the simulated value. This may be because the capacitance C used in simulation is larger than the experimental value. If the simulated C is reduced to obtain closer agreement, the value of the Letter will be increased. Also in Fig. 3(b), there is qualitative agreement of the transients but the low-frequency response is not well simulated. The reason for this is not easy to see because no values have been reported for Re and Rsource, but possibly Rsource should be larger in the simulation. The authors are invited to repeat the simulations with different C and Rsource, and either to show closer agreement or to suggest reasons why Fig. 3(b) simulation does not agree well with experiment. |
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