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1. Elemental Analysis ÔªËØ·ÖÎö Atomic absorption spectroscopy Ô×ÓÎüÊÕ¹âÆ× Auger electron spectroscopy (AES) ¶íЪµç×ÓÄÜÆ× Electron probe microanalysis (EPMA) µç×Ó̽Õë΢·ÖÎö Electron spectroscopy for chemical analysis (ESCA) »¯Ñ§·ÖÎöµç×ÓÄÜÆ× Energy dispersive spectroscopy (EDS) ÄÜÁ¿É«É¢Æ× Flame photometry »ðÑæ¹â¶È·¨ Wavelength dispersive spectroscopy (WDS) X-ray fluorescence XÉäÏßÓ«¹â 2. Molecular and Solid State Analysis ·Ö×ÓÓë¹Ì̬·ÖÎö Chromatography [gas chromatography (GC), size exclusion chromatography (SEC)] É«Æ×[ÆøÏàÉ«Æ×£¬Ìå»ýÅųýÉ«Æ×] Electron diffraction µç×ÓÑÜÉä Electron microscopy [scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning TEM (STEM)] µç×ÓÏÔ΢¾µ Electron spin resonance (ESR) µç×Ó×ÔÐý¹²Õñ Infrared spectroscopy (IR) ºìÍâ¹âÆ× Mass spectrometry ÖÊÆ× Mercury porosimetry ѹ¹¯·¨ Mossbauer spectroscopy ÄÂ˹±¤¶ûÆ× Nuclear magnetic resonance (NMR) ºË´Å¹²Õñ Neutron diffraction ÖÐ×ÓÑÜÉä Optical microscopy ¹âѧÏÔ΢¾µ Optical rotatory dispersion (ORD) Ðý¹âɫɢ Raman spectroscopy ÀÂü¹âÆ× Rutherford back scattering (RBS) ¬ɪ¸£±³É¢Éä Small angle x-ray scattering (SAXS) С½ÇXÉäÏßÉ¢Éä Thermal analysis [differential scanning calorimetry (DSC), thermal gravimetric analysis (TGA), differential thermal analysis (DTA) temperature desorption spectroscopy (TDS), thermomechanical analysis (TMA)] ÈÈ·ÖÎö[²îʾɨÃèÁ¿ÈȼƷ¨£¬ÈÈ-ÖØ·ÖÎö£¬Î¢·ÖÈÈ·ÖÎö£¬ÉýÎÂÍѸ½£¬ÈÈ»úе·ÖÎö] UV spectroscopy ×ÏÍâ¹âÆ× X-ray techniques [x-ray photoelectron spectroscopy (XPS), x-ray diffraction (XRD), x-ray emission, x-ray absorption] XÉäÏß¼¼Êõ [xÉäÏß¹âµç×ÓÄܯף¬xÉäÏßÑÜÉ䣬xÉäÏß·¢É䣬xÉäÏßÎüÊÕ] 3. Surface Characterization Techniques ±íÃæ±íÕ÷¼¼Êõ Electron energy loss spectroscopy (EELS) µç×ÓÄÜÁ¿ËðʧÆ× Ellipsometry ÍÖԲƫÕñÊõ Extended x-ray absorption fine structure (EXAFS) À©Õ¹XÉäÏßÎüÊÕ¾«Ï¸½á¹¹ Helium (or atom) diffraction Lateral (or frictional) force microscopy (LFM) ºáÏò£¨Ä¦²Á£©Á¦ÏÔ΢¾µ Low-energy electron diffraction (LEED) µÍÄܵç×ÓÑÜÉä Magnetic force microscopy (MFM) ´ÅÁ¦ÏÔ΢¾µ Near-edge x-ray adsorption fine structure (NEXAFS) ½ü±ßXÉäÏßÎüÊÕ¾«Ï¸½á¹¹ Near field scanning ½ü³¡É¨Ãè Reflection high-energy electron diffraction (RHEED) ·´Éä¸ßÄܵç×ÓÑÜÉä Scanning tunneling microscopy (STM) ɨÃèËíµÀÏÔ΢¾µ Scanning force microscopy (SFM) ɨÃèÁ¦ÏÔ΢¾µ Secondary ion mass spectroscopy (SIMS) ¶þ´ÎÀë×ÓÖÊÆ× Surface enhanced raman spectroscopy (SERS) ±íÃæÔöÇ¿ÀÂü¹âÆ× Surface extended x-ray adsorption fine structure (SEXAFS) ±íÃæÀ©Õ¹XÉäÏßÎüÊÕ¾«Ï¸½á¹¹ Surface force apparatus ±íÃæÁ¦ÒÇÆ÷ |
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