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ysuren铁杆木虫 (正式写手)
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[求助]
轧制材料的TEM观察，一定要选在RD-ND plane吗？
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下面是我投SCRIPTA MATER的审稿意见中的一句 “The observation plane in TEM characterization was not mentioned in the text, from Fig. 1 it seems that the authors did not choose the proper RD-ND plane, which resulted in an incorrect description of microstructures.” [ Last edited by ysuren on 2011-6-13 at 21:19 ] |
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ysuren
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The microstructural evolution of the SMAT Cu samples was characterized by using a JEM-2010 transmission electron microscope (TEM) operated at a voltage of 200 kV. Cross-sectional thin foils for TEM observations were prepared in the following steps: (i) electroplating a Ni layer of 1.5 mm thick onto the treated surface of the SMAT Cu samples; (ii) cutting a cross-sectional piece of the electroplated sample (with a diameter of 3 mm and a thickness Acta Materialia 54 (2006) 5281–5291 of 0.5 mm) with the treated surface in the middle; (iii) grinding it carefully to about 30 lm thick; (iv) dimpling and ion thinning to perforation at room temperature. |
12楼2011-06-21 21:02:41
turkeyzz
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3楼2011-06-14 11:33:26
ysuren4楼2011-06-14 18:48:33
ysuren
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5楼2011-06-14 20:10:10
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