|
|
wuming1987(金币+15, 翻译EPI+1): 谢谢 2011-01-19 22:04:26
|
AFM is in nanoelectronics distance specimen in nanometer range measuring, in nanoelectronics and sample surface to close formation of a local area of the "field", a local area of field helps people understand the nanometer material surface, molecules, and atomic scale, and detect the morphology of the force between the atoms, molecules and its physical and chemical properties [2]. Because scanning probe microscopy techniques not only has nanoscale resolution, and sample preparation simple, can be in solution zhongyuan bits surface imaging and mechanics, physical and chemical properties of measurement, and it is better than other instruments which are widely used in [3]. AFM through force-distance curve to study material and substance surface interaction, and characterization of many of the properties of the material surface, and on this basis to further performance study [4]. Figure 1 ? for pH value |
|
回复此楼