|
|
★ ★ sirljz(金币+2):谢谢交流 2010-04-30 22:03 lsoul24517(金币+15, 翻译EPI+1):谢谢帮忙 2010-05-03 12:17
X-ray diffraction patterns were recorded by using a Philiphs X’Pert Super diffractometer with graphite monochromatized Cu Ka radiation (1.541 78 ) in the 2õ range of 10°-80°. The morphology of the products was examined by a scanning electron microscope (SEM) using an X-650 microanalyzer. FESEM images were taken on a field emission scanning electron microscope (JEOL JSM-6300F, 15 kV). Transmission electron microscopic (TEM) images were produced with a Hitachi 800 transmission electron microscope with the accelerating voltage of 200 kV. The samples used for characterization were dispersed in absolute ethanol and were ultrasonicated before SEM, FESEM, and TEM tests.
使用石墨单色化Cu, Ka 辐射(1.54178)(这里你的文字不齐,应是一个仪器的操作条件) Philiphs X’Pert Super衍射仪作X射线衍射,在10-80度范围内进行。使用扫描电镜(SEM,X-650微分析仪)对产物作晶形鉴别。场发射扫描电镜(JEQL JSM-6300F,15KV)作FESEM成像。作用Hitachi 800透射电子显微镜作透射电子显微镜图像,使用加速电压200KV。样品分散于无水乙醇中并于SEM,FESEM及TEM测试前超声。 |
|