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¡ï ¡ï sirljz(½ð±Ò+2):лл½»Á÷ 2010-04-30 22:03 lsoul24517(½ð±Ò+15, ·ÒëEPI+1):лл°ïæ 2010-05-03 12:17
X-ray diffraction patterns were recorded by using a Philiphs X¡¯Pert Super diffractometer with graphite monochromatized Cu Ka radiation (1.541 78 ) in the 2õ range of 10¡ã-80¡ã. The morphology of the products was examined by a scanning electron microscope (SEM) using an X-650 microanalyzer. FESEM images were taken on a field emission scanning electron microscope (JEOL JSM-6300F, 15 kV). Transmission electron microscopic (TEM) images were produced with a Hitachi 800 transmission electron microscope with the accelerating voltage of 200 kV. The samples used for characterization were dispersed in absolute ethanol and were ultrasonicated before SEM, FESEM, and TEM tests.
ʹÓÃʯɫ»¯Cu, Ka ·øÉ䣨1.54178£©£¨ÕâÀïÄãµÄÎÄ×Ö²»Æë£¬Ó¦ÊÇÒ»¸öÒÇÆ÷µÄ²Ù×÷Ìõ¼þ£© Philiphs X¡¯Pert SuperÑÜÉäÒÇ×÷XÉäÏßÑÜÉ䣬ÔÚ10-80¶È·¶Î§ÄÚ½øÐС£Ê¹ÓÃɨÃèµç¾µ£¨SEM£¬X-650΢·ÖÎöÒÇ£©¶Ô²úÎï×÷¾§Ðμø±ð¡£³¡·¢ÉäɨÃèµç¾µ£¨JEQL JSM-6300F£¬15KV£©×÷FESEM³ÉÏñ¡£×÷ÓÃHitachi 800͸Éäµç×ÓÏÔ΢¾µ×÷͸Éäµç×ÓÏÔ΢¾µÍ¼Ïñ£¬Ê¹ÓüÓËÙµçѹ200KV¡£ÑùÆ··ÖÉ¢ÓÚÎÞË®ÒÒ´¼Öв¢ÓÚSEM£¬FESEM¼°TEM²âÊÔǰ³¬Éù¡£ |
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