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[资源] 【资源】2010年新书《Scanning Probe Microscopy in Nanoscience and Nanotechnology�

Scanning Probe Microscopy in Nanoscience and Nanotechnology

NanoScience and Technology ISSN 1434-4904
ISBN 978-3-642-03534-0 e-ISBN 978-3-642-03535-7
DOI 10.1007/978-3-642-03535-7
Springer Heidelberg Dordrecht London New York

Nature is the best example of a system functioning on the nanometer scale,
where the materials involved, energy consumption, and data handling are opti-
mized. Opening the doors to the nanoworld, the emergence of the scanning
tunneling microscope in 1982 and the atomic force microscope in 1986 led to
a shift of paradigm in the understanding and perception of matter at its most
fundamental level. As a consequence, new revolutionary concepts stimulated a
number of new technologies. The current volume Scanning Probe Methods in
Nanoscience and Nanotechnology shows that these methods are still making a
tremendous impact on many disciplines that range from fundamental physics
and chemistry through information technology, spintronics, quantum comput-
ing, and molecular electronics, all the way to life sciences. Indeed, over 6,000
AFM-related papers were published in 2008 alone, bringing the total to more
than 70,000 since its invention, according to the web of science, and the STM
has inspired a total of 20,000 papers. There are also more than 500 patents
related to the various forms of scanning probe microscopes. Commercializa-
tion of the technology started at the end of the 1980s, and approximately
12,000 commercial systems have been sold so far to customers in areas as
diverse as fundamental research, the car industry, and even the fashion indus-
try. There are also a signiﬁcant number of home-built systems in operation.
Some 60–80 companies are involved in manufacturing SPM and related instru-
ments. Indeed, not even the sky seems to be the limit for AFM technology.
The Rosetta mission to comet 67P launched by the European Space Agency in
2004 includes an AFM in its MIDAS (Micro-Imaging Dust Analysis System)
instrument. The goal of this mission, which is expected to touch down on 67P
in 2014, is to analyze particle size distributions in comet material. NASA’s
Phoenix mission to Mars in 2008 included an AFM for similar studies (col-
laboration between the Universities of Neuchˆ atel and Basel, as well as with
Nanosurf GmbH).
What does the future hold? Nanotechnology is still dominated to a cer-
tain extent by the top down approach where miniaturization plays a crucial
role. However, there is a worldwide eﬀort to meet the bottom-up approach ofVI Foreword
self-assembly and self-organization that has been so successfully implemented
in the natural world. Researchers are trying to unravel nature’s secrets on a
nanometer scale to create a new generation of materials, devices, and systems
that will spectacularly outperform those we have today in information tech-
nology, medicine and biology, environmental technologies, the energy industry,
and beyond. As we understand better how nature is doing ‘things’ on a fun-
damental level, achievements such as clean chemistry or clean processing will
emerge along with the ability to handle waste problems and not polluting
the environment. New smart materials, hybrid or heterostructured, as well as
carbon nanotubes, a variety of nanowires or graphene could be ingredients for
novel energy-saving devices. In order to understand the whole functionality of
a cell, Systems Biology Institutes have been established with the hope of arti-
ﬁcially synthesizing a cell in a bottom-up approach. Nanomedicine, including
non-invasive diagnostics, will be more and more on the agenda, ﬁghting dis-
eases on the molecular level, e.g. new kinds of drug delivery systems based on
peptides or block co-polymer nanocontainers are being investigated as possible
carriers to target carcinogenic cells. Biology is driven by chemistry; however,
the scaﬀold, the gears, the nuts and bolts, e.g. in cell membranes, is nanome-
chanics, a template that nature has orchestrated during eons of evolution, and
worthwhile trying to copy and implement in novel nanodevices.
However, to keep this worldwide eﬀort alive, the interdisciplinary struc-
ture of nanoscience requires a new breed of scientists educated in all science
disciplines with no language barriers, ready to make an impact on all the
global challenges ahead where nanotechnology can be applied1. Scanning
Probe Microscopy and related methods will still play an important role in
many of these investigations, helping as to capitalize on this fundamental
knowledge, beneﬁcial for future technologies and to mankind.

Basel, Christoph Gerber
August 2009

1 Dynamic Force Microscopy and Spectroscopy Using
the Frequency-Modulation Technique in Air and Liquids
Hendrik H¨ olscher, Daniel Ebeling, Jan-Erik Schmutz, Marcus
M. Sch¨ afer, and Boris Anczykowski ............................... 3
1.1 Introduction............................................... 3
1.2 BasicPrinciplesof theFMTechnique......................... 4
1.2.1 TheEquationofMotion.............................. 4
1.2.2 Oscillation Behavior of a Self-Driven Cantilever . . . . . . . . . 6
1.2.3 Theory of FM Mode Including Tip–Sample Forces . . . . . . . 7
1.2.4 Measuring the Tip–Sample Interaction Force . . . . . . . . . . . . 9
1.2.5 Experimental Comparison of the FM Mode
with the Conventional Amplitude-Modulation-mode
inAir.............................................. 11
1.3 Mapping of the Tip–Sample Interactions on DPPC
MonolayersinAmbientConditions ........................... 12
1.4 Force Spectroscopy of Single Dextran Monomers in Liquid . . . . . . 15
1.5 Summary ................................................. 18
References ..................................................... 19
2 Photonic Force Microscopy: From Femtonewton Force
Sensing to Ultra-Sensitive Spectroscopy
O.M. Marag`o, P.G. Gucciardi, and P.H. Jones ..................... 23
2.1 Introduction............................................... 24
2.2 PrinciplesofOpticalTrapping............................... 24
2.2.1 TheoreticalBackground.............................. 24
2.3 ExperimentalImplementation ............................... 29
2.3.1 Optical Tweezers Set-up. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
2.3.2 BrownianMotionandForceSensing ................... 31
2.3.3 Optical Trapping of Linear Nanostructures . . . . . . . . . . . . . 33
2.4 PhotonicForceMicroscopy.................................. 39
2.4.1 Bio-Nano-Imaging................................... 39
2.4.2 Bio-ForceSensingat theNanoscale .................... 42
2.5 Raman Tweezers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
2.5.1 TheRamanEﬀect................................... 45
2.5.2 ExperimentalConﬁguration........................... 46
2.5.3 Applications ........................................ 48
2.6 Conclusions ............................................... 53
References ..................................................... 53
3 Polarization-Sensitive Tip-Enhanced Raman Scattering
Pietro Giuseppe Gucciardi, Marc Lamy de La Chapel le,
Jean-Christophe Valmalette, Gennaro Picardi, and Razvigor Ossikovski 57
3.1 Introduction............................................... 57
3.2 Tip-EnhancedRamanSpectroscopy .......................... 58
3.2.1 ConceptandAdvantages ............................. 58
3.2.2 Experimental Implementations of TERS with Side
IlluminationOptics.................................. 60
3.2.3 Probes for Tip-Enhanced Raman Spectroscopy . . . . . . . . . . 61
3.3 PolarizedRamanScatteringfromCubicCrystals............... 64
3.3.1 Model for Backscattering Raman Emission in c-Silicon . . . 64
3.3.2 SelectionRules...................................... 67
3.4 Tip-EnhancedFieldModeling ............................... 67
3.4.1 PhenomenologicalModel ............................. 67
3.4.2 NumericalModelsandResults ........................ 70
3.5 Depolarization of Light Scattered by Metallic Tips . . . . . . . . . . . . . 73
3.6 Polarized Tip-Enhanced Raman Spectroscopy of Silicon Crystals . 75
3.6.1 Background Suppression . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
3.6.2 Selective Enhancement of the Raman Modes
InducedbyDepolarization............................ 80
3.6.3 Evaluationof theFieldEnhancementFactor ............ 84
3.7 Conclusions ............................................... 85
References ..................................................... 86
4 Electrostatic Force Microscopy and Kelvin Force
Microscopy as a Probe of the Electrostatic and Electronic
Properties of Carbon Nanotubes
Thierry M´ elin, Mariusz Zdrojek, and David Brunel .................. 89
4.1 Introduction............................................... 89
4.2 Electrostatic Measurements at the Nanometer Scale . . . . . . . . . . . . 90
4.2.1 ElectrostaticForceMicroscopy........................ 90
4.2.2 KelvinForceMicroscopy ............................. 93
4.2.3 LateralResolutioninEFMandKFM.................. 94
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http://d.namipan.com/d/500244c129ff59484b6e90a86b634e4ba8592091205edb01

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