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Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry I£¬II£¬III ![]() ×÷ÕߣºAmelinckx, Dirk van Dyck, J. van Landuyt, and Gustaaf van Tendeloo Publisher: Wiley-VCH Verlag GmbH Èý¾í±¾ Publication Date: 1996-12 ISBN-10 / ASIN: 3527294732 ISBN-13 / EAN: 9783527294732 Binding: Paperback 1.Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 1: Methods I 2.Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 2: Methods II 3.Handbook of Microscopy: Applications in Materials Science, Solid-State Physics and Chemistry, Volume 3: Applications Volume 1: Methods I I Light Microscopy 1 Fundamentals of Light Microscopy E Miicklich 2 Optical Contrasting of Microstructures E Mucklich 3 Raman Microscopy P. Dhamelincourt, J. Barbillat 4 Three-Dimensional Light Microscopy E. H. K. Stelzer 5 Near Field Optical Microscopy D. Courjon, M. Spajer 6 Infrared Microscopy J. P. Huvenne. B. Sombret I1 X-Ray Microscopy 1 Soft X-Ray Imaging G. Schmahl 2 X-Ray Microradiography D. Mouze 3 X-Ray Microtomography J. Cazaux 4 Soft X-Ray Microscopy by Holography D. Joyeux 5 X-Ray Diffraction Topography M. Schlenker, J. Baruchel I11 Acoustic Microscopy 1 Acoustic Microscopy A. Bviggs IV Electron Microscopy 1 1.1 1.1.1 1.1.2 1.2 1.3 1.4 1.5 1.6 1.7 1.8 Stationary Beam Methods Transmission Electron Microscopy Diffraction Contrast Transmission Electron Microscopy S. Amelinckx High-Resolution Electron Microscopy D. Van Dyck Reflection Electron Microscopy J. M. Cowley Electron Energy-Loss Spectroscopy Imaging C. Colliex High Voltage Electron Microscopy H. Fujita Convergent Beam Electron Diffraction D. Cherns, J. W. Steeds, R. Vincent Low-Energy Electron Microscopy E. Bauer Lorentz Microscopy J. P. Jakubovics Electron Holography Methods H. Lichte Stationary Beam Methods Transmission Electron Microscopy Diffraction Contrast Transmission Electron Microscopy S. Amelinckx High-Resolution Electron Microscopy D. Van Dyck Reflection Electron Microscopy J. M. Cowley Electron Energy-Loss Spectroscopy Imaging C. Colliex High Voltage Electron Microscopy H. Fujita Convergent Beam Electron Diffraction D. Cherns, J. W. Steeds, R. Vincent Low-Energy Electron Microscopy E. Bauer Lorentz Microscopy J. P. Jakubovics Ö»ÁгöµÚÒ»¾íµÄĿ¼ Product Description Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?" ÏÂÔØµØÖ·£ºhttp://d.namipan.com/d/c44a1d4bd ... edb5567fcb786d3c402 Èç¹û¾õµÃºÃ¾Í¸ø¸öÐÇÐÇ£¡ http://d.namipan.com/d/c44a1d4bdeb7605797f79c401ec8fedb5567fcb786d3c402 [ Last edited by 17173tang on 2010-1-20 at 06:31 ] |
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