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ÎҵǽÁË http://www.ieee.org/web/conferences/search/index.html IEEE»áÒé²éÑ¯ÍøÕ¾£¬²éѯÁË»áÒ鹨¼ü´ÊICTM ½á¹û³öÏÖÈçÏÂÇé¿ö£¬¼û¸½¼þ Ôõô¿´»áÒéÊÇ·ñ±»EIºÍISTPÊÕ¼°¡£¿ |
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3Â¥2009-12-03 10:58:15
csl01514218
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ÎҵǽÁË http://www.ieee.org/web/conferences/search/index.html IEEE»áÒé²éÑ¯ÍøÕ¾£¬²éѯÁË»áÒ鹨¼ü´ÊICTM ½á¹û³öÏÖÈçÏÂÇé¿ö£¬¼û¸½¼þ Ôõô¿´»áÒéÊÇ·ñ±»EIºÍISTPÊÕ¼°¡£¿ ÎÒ²éѯµÄICTM2009»áÒéÐÅÏ¢ÈçÏ£º Here are the details of your conference selection: Conference: 2009 International Conference on Test and Measurement (ICTM) Conference Dates: 05 Dec - 06 Dec 2009 Location: Hong Kong Hong Kong, Hong Kong Conference Web Site: http://www.ictm2009.cn/ Conference Scope: We are delighted to invite you to participate in 2009 International Conference on Test and Measurement in Hong Kong.The objective of ICTM 2009 is to provide a forum for researchers, educators, engineers, and government officials involved in the general areas of Test and Measurement to disseminate their latest research results and exchange views on the future research directions of these fields Focus: Application Science Attendance: 300 Tutorials: N Exhibits: N IEEE Sponsor(s): Instrumentation and Measurement Society - IM Other Sponsor(s): Intelligent Information Technology Application Research Institute - H Wuhan Institute of Technology Publications: Information Contact: Qi Luo 693 Xiongchu Avenue Wuhan Institute of Technology CHINA Wuhan Hubei 430073 +86 13971194454 ccnu_luo2008@yahoo.com.cn Conference #: 15850 [ Last edited by csl01514218 on 2009-12-3 at 20:41 ] |
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