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×îÇ¿º·µÄ¡°±¡Ä¤²ÄÁÏ¡±µÄÓ¢ÎIJο¼Êé Õâô¶àÄêÀ´£¬ÎÒÈÏΪ×îºÃµÄ¡¢×îÈ«ÃæµÄÒ»±¾±¡Ä¤²ÄÁϵÄÊé¼®¡£ÍâÎÄ԰棬ÓïÑÔºÜÈÝÒ×Àí½â¡£ÏàÐŶÔÐÐÄÚµÄͬ־ÊDZ¾ÄѵõIJο¼Êé¡£·ÖÏíµÄͬʱ²»ÒªÍüÁ˸øÎÒÕâ¸öÐÂÊÖBBŶ£¨×¥½ô°É£¬10Ììºó½«»áɾ³ý£©¡£ÏÂÃæÊÇĿ¼£º Preface 1 Introduction and Overview 1 1.1 A classi¯cation of thin ¯lm con¯gurations 3 1.2 Film deposition methods 6 1.3 Modes of ¯lm growth by vapor deposition 17 1.4 Film microstructures 33 1.5 Processing of microelectronic structures 52 1.6 Processing of MEMS structures 57 1.8 Growth stress in polycrystalline ¯lms 69 1.9 Consequences of stress in ¯lms 90 1.10 Exercises 91 2 Film stress and substrate curvature 93 3 Stress in anisotropic and patterned films 167 4 Delamination and fracture 239 5 Film buckling, bulging and peeling 341 6. Dislocation formation in epitaxial systems 422 7 Dislocation interactions and strain relaxation 506 8 Equilibrium and stability of surfaces 599 9 The role of stress in mass transport 697 http://www.namipan.com/d/Thin%20Film%20Materials-%20Stress%2c%20Defect%20Formation.pdf/d8069a87814079e3f8c94ecd6d9698d118091661de61c600 [ Last edited by zxz.1982 on 2009-9-28 at 20:28 ] |
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