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runforaim(½ð±Ò+1,VIP+0):¸Ðл°ïÖú 8-21 10:28
runforaim(½ð±Ò+1,VIP+0):¸Ðл°ïÖú 8-21 10:28
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Chaos Analysis of The Influence of Tensile Stress on Electrochemical Noise ¸ü¶àÑ¡Ïî ×÷Õß: Zhan J (Zhan, Jun)1, Liu XF (Liu, Xiaofang)1, Zhang Q (Zhang, Qian)1, Liu QJ (Liu, Qingjie)1, Long F (Long, Feng)1 ±àÕß: Luo Q; Zhou QH À´Ô´³ö°æÎï: 2009 INTERNATIONAL CONFERENCE ON INDUSTRIAL MECHATRONICS AND AUTOMATION Ò³: 418-421 ³ö°æÄê: 2009 ±»ÒýƵ´Î: 0 ²Î¿¼ÎÄÏ×: 6 ÒýÖ¤¹ØÏµÍ¼ »áÒéÐÅÏ¢: International Conference on Industrial Mechatronics and Automation Chengdu, PEOPLES R CHINA, MAY 15-16, 2009 Intelligent Informat Technol Applicat Res Assoc; IEEE SMC TC Educ Technol &Training; Engn Technol Press; Wuhan Inst Technol; IEEE Ind Applicat Soc ÕªÒª: In this paper, chaos theory was used to analyze the influence of tensile stress on electrochemical noise about 7075-T76 aluminum alloy in 3.5%NaCl solutions. The result shows that the applied stress accelerated the formation of electric double-layer and the greater the stress, the shorter the formation time. Electrochemical noise data in the phase had strong linear autocorrelation whose largest lyapunov exponents were negative. Electrochemical noise data was not chaotic. The greater the stress, the larger the largest LE and the steady trend. After the formation of electric double-layer, electrochemical noise data in the phase had weak linear autocorrelation. With the increasing of the stress, largest lyapunov exponents were smaller whose range were (0 1). Electrochemical noise data had weak chaos and periodicity. Fractal dimension of electrochemical noise in the phase had the same change trend with largest lyapunov exponents. The stress can lead to stabilization of electrochemical signals and decrease fluctuation. ÎÄÏ×ÀàÐÍ: Proceedings Paper ÓïÑÔ: English ×÷Õ߹ؼü´Ê: chaos; corrosion; electrochemical noise; largest lyapunov exponent; fractal dimension; stress ͨѶ×÷ÕßµØÖ·: Zhan, J (ͨѶ×÷Õß), Second Artillery Engn Coll, Xian, Peoples R China µØÖ·: 1. Second Artillery Engn Coll, Xian, Peoples R China ³ö°æÉÌ: IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA IDS ºÅ: BKN32 ISBN: 978-1-4244-3818-1 |
4Â¥2009-08-21 10:23:30
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