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zjys5887ľ³æ (ÎÄ̳¾«Ó¢)
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¡¾×ÊÔ´¡¿Surface Analysis with STM and AFM
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Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for the examination of surfaces. The research, development, and application of the STM and AFM methods are currently making rapid progress. As a result, a large number of papers are being published every year on diverse subjects, from theory to experiment as well as on applications to a variety of materials. This makes it rather difficult for an individual to keep up with such fast development. The physical concepts employed in the instrumentation of STM and AFM are simple, but the interpretation of the STM and AFM results can be complicated because of the convolution of several interactions in the measurement process. This complication exists in the large-scale imaging of surface morphology as well as in the molecular- and atomic-scale images. Thus, many STM and AFM studies can be misinterpreted. To help to alleviate this problem, we felt it necessary to bring together into a book the essential components of STM and AFM studies, namely the practical aspects of STM and AFM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip force induced surface corrugations. ............................. http://d.namipan.com/d/74531fe82 ... b6da58837f810f73801 http://d.namipan.com/d/74531fe82 ... b6da58837f810f73801 http://d.namipan.com/d/74531fe82dc7bcc97b7cbc36bb5fab6da58837f810f73801 |
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