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[资源] 【资源】B-H 2009新书: Atomic Force Microscopy in Process Engineeri【无重复】

W. Richard Bowen, Nidal Hilal - Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

Butterworth-Heinemann | 2009 | ISBN: 1856175170 | Pages: 352 | PDF | 6.70 MB

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products.

This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.

The book takes a rigorous but practical approach to ensure that it is also directly applicable to practical process engineering problems. Fundamentals of the techniques are concisely described and specific benefits for process engineering clearly defined and illustrated. Coverage of applications of AFM to important areas of process engineering is comprehensive. Each of the chapter authors are recognized authorities on their subject.

* The only book dealing with the theory and practical applications of atomic force microscopy in process engineering

* Strikes the correct balance between developing an understanding of AFM principles and providing best-practice guidance and experience on using AFM in practice for process and product improvement

* Written by the engineers and scientists who pioneered this field

关于原子力显微的一本好书。。。

链接地址(推荐Chrome下载，速度很快)

http://rapidshare.com/files/261608230/hj46.rar

期待好评