| ²é¿´: 735 | »Ø¸´: 0 | |||
TAINSTÌú³æ (ÕýʽдÊÖ)
|
[½»Á÷]
Tzero¼¼ÊõÈçºÎÌáÉýDSCÐÔÄÜ£º¼õÉÙÈÈÖͺó
|
|
As the furnace of any DSC is temperature programmed, the temperature of the sample lags behind the programmed temperature (and behind the ¡°sample temperature¡± sensor) because the heat must flow across a barrier to get to the encapsulated sample. The thermal lag is greatest when the thermal demands of the sample are greatest, such as during sample melting. The magnitude of this lag depends on a number of experimental factors, and consequently it is left up to the user to make the correction to the analyzed data through calibration. With the availability of Advanced TzeroTM Technology from TA Instruments, the introduction of an independent T0 sensor on the DSC disk (in addition to the sample and reference temperature sensors) provides a tool for calibration of the thermal lag characteristics of both the cell and of the pan encapsulating the sample. As a result, the sample data generated by the Q1000TM DSC contains a compensation for the thermal lag caused by the sample pan and the DSC cell. The reported temperature data is automatically corrected for these thermal lags. This measurably improves the accuracy of reporting peak temperatures for a wide range of applications. |
» ±¾Ìû¸½¼þ×ÊÔ´Áбí
-
»¶Ó¼à¶½ºÍ·´À¡£ºÐ¡Ä¾³æ½öÌṩ½»Á÷ƽ̨£¬²»¶Ô¸ÃÄÚÈݸºÔð¡£
±¾ÄÚÈÝÓÉÓû§×ÔÖ÷·¢²¼£¬Èç¹ûÆäÄÚÈÝÉæ¼°µ½ÖªÊ¶²úȨÎÊÌ⣬ÆäÔðÈÎÔÚÓÚÓû§±¾ÈË£¬Èç¶Ô°æÈ¨ÓÐÒìÒ飬ÇëÁªÏµÓÊÏ䣺xiaomuchong@tal.com - ¸½¼þ 1 : Tzero¼¼ÊõÈçºÎÌáÉýDSCÐÔÄÜ£º¼õÉÙÈÈÖͺó.pdf
2017-02-24 16:20:05, 363.9 K
» ²ÂÄãϲ»¶
ÓжàÉÙÈËÊǽñÌì²éϵͳ֪µÀ½á¹ûµÄ£¿
ÒѾÓÐ17È˻ظ´
¹ú×ÔÈ»ÃæÉϸ´ÅÌ~»¶ÓÌÖÂÛ
ÒѾÓÐ6È˻ظ´
ÊÛSCIÒ»ÇøÎÄÕ£¬ÎÒ:8.O.551.O.5.4,¿ÆÄ¿È«,¿ÉÙ¤¼±
ÒѾÓÐ4È˻ظ´
ÊÛSCIÒ»ÇøT0PÎÄÕ£¬ÎÒ:8.O.55.1.O.54,¿ÆÄ¿ÆëÈ«,¿É+¼±
ÒѾÓÐ4È˻ظ´
»ù½ð²»ÖУ¬¹²Ãã
ÒѾÓÐ5È˻ظ´
¿´°åÉÏÕâô¶àÖеģ¬ÓеãÏñ50ÈËȺÀï49¸öÈ˶¼ÊÇÆ×ÓµÄÄÇÖָоõ¡¡
ÒѾÓÐ3È˻ظ´
ÎÒ²»Àí½â£¡
ÒѾÓÐ23È˻ظ´
2026ÄêµÄ¹ú¼ÒÉç¿Æ»ù½ðÏîĿͨѶÆÀÉóµÄйæÔòÓëж¯Ïò¡¢ÐÂÌôÕ½
ÒѾÓÐ10È˻ظ´
ϵͳ²é²»µ½
ÒѾÓÐ10È˻ظ´
Ôõô²é°¡
ÒѾÓÐ5È˻ظ´









»Ø¸´´ËÂ¥