24小时热门版块排行榜

>论坛更新日志 (1545)
>虫友互识 (123)
>论文道贺祈福 (43)
>导师招生 (26)
>仿真模拟 (23)
>基金申请 (20)
>硕博家园 (19)
>考研 (16)
>论文投稿 (14)
>公派出国 (13)
>休闲灌水 (13)
>博后之家 (12)
>找工作 (12)
>文献求助 (11)
>教师之家 (10)
>考博 (10)

返回列表

当前只显示满足指定条件的回帖，点击这里查看本话题的所有回帖

yyuhmj17

金虫 (小有名气)

应助: 0 (幼儿园)
金币: 278.1
帖子: 81
在线: 15.5小时
虫号: 3034361

[交流] 【2015-06-18】第16届半导体缺陷识别、成像与物理国际学术会议（DRIP XVI)

会议城市:

江苏省苏州市

是否Ei/ISTP收录:

Ei/ISTP双收录

截稿日期:

2015年6月18日

碌脷16陆矛掳毛碌录脤氓脠卤脧脻脢露卤冒隆垄鲁脡脧帽脫毛脦茂脌铆鹿煤录脢脩搂脢玫禄谩脪茅
拢篓脫垄脦脛脙没鲁脝拢潞 16th International Conference on Defects-Recognition,Imaging and Physics in Semiconductors隆拢录貌鲁脝拢潞DRIP XVI 拢漏
陆芦脫脷2015脛锚9脭脗6脠脮脰脕9脭脗10脠脮脭脷陆颅脣脮脢隆脣脮脰脻脢脨戮脵脨脨,禄谩脪茅脫脡脰脨鹿煤驴脝脩搂脭潞脣脮脰脻脛脡脙脳录录脢玫脫毛脛脡脙脳路脗脡煤脩脨戮驴脣霉脰梅掳矛拢卢脮茫陆颅麓贸脩搂鹿猫虏脛脕脧鹿煤录脪脰脴碌茫脢碌脩茅脢脪潞脥脧脙脙脜麓贸脩搂脦茂脌铆脩搂脭潞碌脠碌楼脦禄脨颅掳矛隆拢
赂脙禄谩脪茅脫脷1985脛锚脭脷路篓鹿煤脙脡卤脣脌没掳拢麓麓掳矛拢卢脙驴脕陆脛锚戮脵脨脨脪禄麓脦拢卢脪脩戮颅脭脷鹿煤录脢掳毛碌录脤氓脩脨戮驴脕矛脫貌脨脦鲁脡鹿茫路潞碌脛脫掳脧矛隆拢
麓贸禄谩脰梅脧炉脫脡脮茫陆颅麓贸脩搂脩卯碌脗脠脢陆脤脢脷潞脥脧脙脙脜麓贸脩搂驴碌驴隆脫脗陆脤脢脷鲁脨碌拢拢卢麓贸禄谩脰梅脦炉禄谩脰梅脧炉脫脡脰脨鹿煤驴脝脩搂脭潞脣脮脰脻脛脡脙脳录录脢玫脫毛脛脡脙脳路脗脡煤脩脨戮驴脣霉脩卯禄脭脩脨戮驴脭卤潞脥脨矛驴脝脩脨戮驴脭卤碌拢脠脦隆拢
掳毛碌录脤氓脠卤脧脻脢露卤冒隆垄鲁脡脧帽脫毛脦茂脌铆鹿煤录脢禄谩脪茅脢脟脭脷掳毛碌录脤氓脦茂脌铆隆垄虏脛脕脧驴脝脩搂脕矛脫貌戮脽脫脨鹿煤录脢脫掳脧矛脕娄碌脛鹿煤录脢脩搂脢玫禄谩脪茅拢卢脳脭1985脛锚麓麓掳矛脪脭脌麓拢卢脪脩戮颅脕卢脨酶戮脵掳矛15陆矛隆拢禄谩脪茅脰脗脕娄脫脷脤陆脣梅脠卤脧脻鲁脡脧帽录录脢玫隆垄脠卤脧脻脦茂脌铆隆垄虏脛脕脧脦茂脌铆脤脴脨脭录掳脝梅录镁脨脭脛脺脰庐录盲碌脛鹿脴脧碌拢卢脭脷脥脝陆酶鹿煤录脢掳毛碌录脤氓录录脢玫路垄脮鹿路陆脙忙脝冒碌陆脰脴脪陋脳梅脫脙隆拢陆眉脛锚脌麓拢卢脧脿鹿脴鹿煤录脢脟掳脩脴录录脢玫潞脥驴脝脩脨脠脠碌茫录炉脰脨脫脷赂眉赂脽驴脮录盲路脰卤忙脗脢潞脥碌脥脦卢脧碌脥鲁脰脨碌脛脠卤脧脻脢露卤冒潞脥脠脧脰陋拢卢赂脙脕矛脫貌脪虏脢脟脣脮脰脻脛脡脙脳脣霉碌脛脦麓脌麓脰脴碌茫路垄脮鹿路陆脧貌隆拢麓脣麓脦禄谩脪茅脭脷禄陋戮脵掳矛拢卢陆芦露脭脫脷麓脵陆酶脦脪鹿煤脫毛鹿煤录脢掳毛碌录脤氓虏脛脕脧脩搂脢玫陆莽陆禄脕梅隆垄脌漏麓贸脦脪鹿煤脭脷鹿煤录脢掳毛碌录脤氓虏脛脕脧脩脨戮驴脕矛脫貌碌脛脫掳脧矛戮脽脫脨路脟鲁拢脰脴脪陋碌脛脪芒脪氓拢卢禄露脫颅鹿茫麓贸脩搂脮脽脌脧脢娄鲁脰脨酶鹿脴脳垄拢卢脫禄脭戮虏脦录脫隆拢
禄谩脪茅脰梅脤芒拢潞
Physics of point and extended defects in semiconductors: origin, electrical, optical and magnetic properties of defects
Diagnostics techniques of crystal growth and processing of semiconductor materials (in-situ and process control)
Device imaging and mapping to evaluate performance and reliability
Defect analysis in degraded optoelectronic and electronic devices
Imaging techniques and instruments (proximity probe, x-ray, electron beam, noncontact electrical, optical and thermal imaging techniques, etc.)
New frontiers of atomic-scale-defect assessment (STM, AFM, SNOM, ballistic electron energy microscopy, TEM, etc.)
New approaches for multi-physic-parameter characterization with nano-scale space resolution
脥露赂氓脕梅鲁脤拢潞
碌脟脗录https://dripxvi.csp.escience.cn/dct/page/70004 脭脷脧脽脤谩陆禄脮陋脪陋拢篓2015脛锚6脭脗18脠脮陆脴脰鹿拢漏
鲁媒路脟脤脴卤冒脳垄脙梅拢卢脦脪脙脟陆芦脛卢脠脧脣霉脫脨碌脛脥露赂氓露录脳梅脦陋驴脷脥路卤篓赂忙&脟陆卤篓脣芦脪芒脧貌赂氓录镁
脰梅掳矛路陆陆芦脭脷2015脛锚7脭脗20脠脮潞贸脥篓脰陋脗录脠隆陆谩鹿没拢卢脥篓鹿媒脠芦脦脛脡贸赂氓碌脛脦脛脮脗陆芦路垄卤铆脭脷Superlattices and Microstructures拢篓脤脴驴炉拢漏隆拢
禄谩脪茅脥酶脮戮拢潞https://dripxvi.csp.escience.cn/
禄谩脦帽脳茅脕陋脧碌路陆脢陆拢潞 e-mail:drip16@163.com tel拢潞0512-62872807 fax拢潞0512-62868158