Title: Optical techniques for solid-state materials characterization
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![材料的光学表征技术(英文版)]()
Author(s): Rohit P Prasankumar; Antoinette J Taylor
Publisher: CRC Press
City: Boca Raton
Year: 2011
Language: English
Pages: xxii, 718 p.. (some col.) ; 27 cm
Table of contents :
Content: BACKGROUND Light-Matter Interactions, Willie J. Padilla Semiconductors and Their Nanostructures, Jeffrey Davis and Chennupati Jagadish The Optical Properties of Metals: From Wideband to Narrowband Materials, Richard D. Averitt LINEAR OPTICAL SPECTROSCOPY Methods for Obtaining the Optical Constants of a Material, Hidekazu Okamura Methods for Obtaining the Optical Response after CW Excitation, Sajan Saini Raman Scattering as a Tool for Studying Complex Materials, S. Lance Cooper, Peter Abbamonte, Nadya Mason, C. S. Snow, Minjung Kim, Harini Barath, John F. Karpus, Cesar E. Chialvo, James P. Reed, Young-Il Joe, Xiaoqian Chen, Diego Casa, and Y. Gan TIME-RESOLVED OPTICAL SPECTROSCOPY Ultrashort Pulse Generation and Measurement, Andrew Kowalevicz Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation, Jure Demsar and Thomas Dekorsy Ultrafast Pump-Probe Spectroscopy, David J. Hilton Transient Four-Wave Mixing, Steven T. Cundiff Time-Domain and Ultrafast Terahertz Spectroscopy, Robert A. Kaindl Time-Resolved Photoluminescence Spectroscopy, Marc Achermann Time-Resolved Magneto-Optical Spectroscopy, Jigang Wang Time-Resolved Raman Scattering, Daniele Fausti and Paul H.M. van Loosdrecht SPATIALLY RESOLVED OPTICAL SPECTROSCOPY Microscopy, Alexander Neumann, Yuliya Kuznetsova, and Steven R.J. Brueck Micro-Optical Techniques, Kartik Srinivasan, Matthew T. Rakher, and Marcelo Davanco Near-Field Scanning Optical Microscopy, Ben Mangum, Eyal Shafran, Jessica Johnston, and Jordan Gerton RECENT DEVELOPMENTS Recent Developments in Spatially and Temporally Resolved Optical Characterization of Solid-State Materials, Rohit P. Prasankumar and Antoinette J. Taylor Index |