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wenke1526

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[资源] 2012-SEM英文新书《Scanning Electron Microscopy》

Scanning Electron Microscopy
Edited by Viacheslav Kazmiruk, ISBN 978-953-51-0092-8, Hard cover, 830 pages, Publisher: InTech, Published: March 09, 2012

Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging but quantitative measurement of object topologies, local electrophysical characteristics of semiconductor structures and performing elemental analysis. Moreover, a fine focused e-beam is widely used for the creation of micro and nanostructures. The book's approach covers both theoretical and practical issues related to scanning electron microscopy. The book has 41 chapters, divided into six sections: Instrumentation, Methodology, Biology, Medicine, Material Science, Nanostructured Materials for Electronic Industry, Thin Films, Membranes, Ceramic, Geoscience, and Mineralogy. Each chapter, written by different authors, is a complete work which presupposes that readers have some background knowledge on the subject.
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文件太大了，第二部分一直没上传成功，添加个网盘网址吧：
part2:http://pan.baidu.com/share/link? ... 5562
两部分都下载，同时解压才有效撒
[ 来自科研家族新能源家族 ]

[ Last edited by wenke1526 on 2012-11-15 at 22:20 ]

2015-03-16补充：
文件已经重新上传到百度云了
http://pan.baidu.com/s/1gdhCE6R

[ Last edited by wenke1526 on 2015-3-16 at 15:19 ]

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