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2012原子力显微分析新著 Atomic Force Microscopy
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书名：Atomic Force Microscopy - Imaging, Measuring and Manipulating Surfaces at the Atomic Scale Edited by Victor Bellitto, ISBN 978-953-51-0414-8, Hard cover, 256 pages, Publisher: InTech, Published: March 23, 2012 With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development  2058.jpg [ 来自科研家族 锂电池世界 ] |
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2012-11-06 15:16:54, 19.81 M
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